Emerging role of semiconductor process equipment to overcome device failure mechanisms

Author(s):  
A.K. Sinha ◽  
F. Moghadam ◽  
R. Mosley ◽  
M. Chang ◽  
R. Ellwanger
Author(s):  
Jin Young Kim ◽  
R. E. Hummel ◽  
R. T. DeHoff

Gold thin film metallizations in microelectronic circuits have a distinct advantage over those consisting of aluminum because they are less susceptible to electromigration. When electromigration is no longer the principal failure mechanism, other failure mechanisms caused by d.c. stressing might become important. In gold thin-film metallizations, grain boundary grooving is the principal failure mechanism.Previous studies have shown that grain boundary grooving in gold films can be prevented by an indium underlay between the substrate and gold. The beneficial effect of the In/Au composite film is mainly due to roughening of the surface of the gold films, redistribution of indium on the gold films and formation of In2O3 on the free surface and along the grain boundaries of the gold films during air annealing.


1997 ◽  
Vol 85 (1-3) ◽  
pp. 1213-1214 ◽  
Author(s):  
Ramesh K. Kasim ◽  
Yang Cheng ◽  
Martin Pomerantz ◽  
Ronald L. Elsenbaumer

Nanoscale ◽  
2021 ◽  
Author(s):  
Mahdi Zeidi ◽  
Chun Il Kim ◽  
Chul B B. Park

Interface plays a crucial role on the physical and functional properties of polymer nanocomposites, yet its effects have not been fully recognized in the setting of classical continuum-based modeling. In...


1993 ◽  
Vol 36 (4) ◽  
pp. 39-45
Author(s):  
J. Hu ◽  
D. Barker ◽  
A. Dasgupta ◽  
A. Arora

Accelerated life testing techniques provide a short-cut method to investigate the reliability of electronic devices with respect to certain dominant failure mechanisms that occur under normal operating conditions. However, accelerated tests have often been conducted without knowledge of the failure mechanisms and without ensuring that the test accelerated the same mechanism as that obscrved under normal operating conditions. This paper summarizes common failure mechanisms in electronic devices and packages and investigates possible failure mechanism shifting during accelerated testing.


1990 ◽  
Vol 194 ◽  
Author(s):  
S. M. Jeng ◽  
C. J. Yang ◽  
J.-M. Yang ◽  
D. G. Rosenthal ◽  
J. Goebel

AbstractThe mechanical properties and failure mechanisms of the SCS-6/Ti3Al composite have been studied. Both tensile and notched bend tests were conducted at room temperature on the monolithic and fiber-reinforced Ti-25Al-10Nb-3V-1Mo. Optical and scanning electron microscopy were used to study the crack initiation and propagation mechanisms. The role of the fiber, matrix and interfacial properties on the composite behavior was also assessed.


2014 ◽  
Vol 624 ◽  
pp. 502-509 ◽  
Author(s):  
Ismael Basilio ◽  
Roberto Fedele ◽  
Paulo B. Lourenço ◽  
Gabriele Milani

In this contribution, original limit analysis numerical results are presented dealing with some reinforced masonry arches tested at the University of Minho-UMinho, PT. Twelve in-scale circular masonry arches were considered, reinforced in various ways at the intrados or at the extrados. GFRP reinforcements were applied either on undamaged or on previously damaged elements, in order to assess the role of external reinforcements even in repairing interventions. The experimental results were critically discussed at the light of limit analysis predictions, based on a 3D FE heterogeneous upper bound approach. Satisfactory agreement was found between experimental evidences and the numerical results, in terms of failure mechanisms and peak load.


Author(s):  
Wolff-Ragnar Kiebach ◽  
Ruth Knibbe ◽  
Kristian B. Frederiksen ◽  
Ming Chen ◽  
Lars Mikkelsen ◽  
...  

The two braze alloys TiCuNi® and Silver-ABA® were tested as possible candidates for seals in SOFC or SOEC stacks. The different Ti amount in the samples allowed an evaluation of Ti as a matrix filler and as an active metal/wetting agent in brazing alloys. The sealing ability towards ferritic steel and yttria-stabilized-zirconia (YSZ) was investigated. After the sealing process steel/braze/YSZ joints were further annealed in oxidizing (Air) or reducing (9% H2 in Ar) atmospheres at 750 °C for 150 h. The boundaries of the braze and the joining partners for as-sealed and annealed samples were examined with SEM/EDS. XRD and EXAFS were used to characterize reaction products after the annealing process. Based on these results and taking before reported data into consideration, the advantages and disadvantages of Ti containing seals and the role of Ti in failure mechanism are discussed. Even if the use of Ti in active brazing alloys has its benefits, the disadvantages caused by Ti and its reaction products strongly suggest the use of Ti free brazes in SOFC/SOEC applications.


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