The effects of minute impurities (H, OH, F) on the SiO/sub 2//Si interface investigated by nuclear resonant reaction and electron spin resonance

2003 ◽  
Author(s):  
Y. Ohji ◽  
Y. Nishioka ◽  
K. Yokogawa ◽  
K. Mukai ◽  
Q. Qiu ◽  
...  
Keyword(s):  
Electron Spin Resonance ◽  
Electron Spin ◽  
Spin Resonance ◽  
Resonant Reaction

The Effects of Minute Impurities (H, OH, F) on the SiO2/Si Interface Investigated by Nuclear Resonant Reaction and Electron Spin Resonance

1989 ◽  
Author(s):  
Yuzuru Ohji ◽  
Yasushiro Nishioka ◽  
Ken'etsu Yokogawa ◽  
Kiichiro Mukai ◽  
Qi Qiu ◽  
...  
Keyword(s):  
Electron Spin Resonance ◽  
Electron Spin ◽  
Spin Resonance ◽  
Resonant Reaction

Electron spin resonance of palladium-related defect in silicon

2009 ◽  
Vol 404 (23-24) ◽  
pp. 4586-4589
Author(s):  
T. Ishiyama ◽  
S. Kimura ◽  
Y. Kamiura ◽  
Y. Yamashita
Keyword(s):  
Electron Spin Resonance ◽  
Electron Spin ◽  
Spin Resonance ◽  
Related Defect
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