Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35¿m Triple-Well Process
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2017 ◽
Vol 64
(7)
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pp. 1135-1143
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2018 ◽
Vol 65
(1)
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pp. 46-52
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2009 ◽
Vol 30
(1)
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pp. 014004
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