Tool replacement based on pattern recognition with LAD

2015 ◽  
Author(s):  
Yasser Shaban ◽  
Soumaya Yacout ◽  
Marek Balazinski
Keyword(s):  
Pattern Recognition ◽  
Tool Replacement

Tool Wear Monitoring and Alarm System Based on Pattern Recognition With Logical Analysis of Data

2015 ◽  
Vol 137 (4) ◽  
Author(s):  
Yasser Shaban ◽  
Soumaya Yacout ◽  
Marek Balazinski
Keyword(s):  
Pattern Recognition ◽  
Tool Wear ◽  
Proportional Hazards Model ◽  
Optimization Technique ◽  
Logical Analysis ◽  
Alarm System ◽  
Logical Analysis Of Data ◽  
Tool Wear Monitoring ◽  
Wear Monitoring ◽  
Tool Replacement

This paper presents a new tool wear monitoring and alarm system that is based on logical analysis of data (LAD). LAD is a data-driven combinatorial optimization technique for knowledge discovery and pattern recognition. The system is a nonintrusive online device that measures the cutting forces and relates them to tool wear through learned patterns. It is developed during turning titanium metal matrix composites (TiMMCs). These are a new generation of materials which have proven to be viable in various industrial fields such as biomedical and aerospace. Since they are quite expensive, our objective is to increase the tool life by giving an alarm at the right moment. The proposed monitoring system is tested by using the experimental results obtained under sequential different machining conditions. External and internal factors that affect the turning process are taken into consideration. The system's alarm limit is validated and is compared to the limit obtained when the statistical proportional hazards model (PHM) is used. The results show that the proposed system that is based on using LAD detects the worn patterns and gives a more accurate alarm for cutting tool replacement.

Monitoring Drilling Wear States by a Fuzzy Pattern Recognition Technique

1988 ◽  
Vol 110 (3) ◽  
pp. 297-300 ◽  
Author(s):  
P. G. Li ◽  
S. M. Wu
Keyword(s):  
Pattern Recognition ◽  
Pattern Recognition Technique ◽  
New Approach ◽  
Fuzzy Pattern Recognition ◽  
Fuzzy Pattern ◽  
On Line ◽  
Tool Replacement ◽  
Simulation Results ◽  
Recognition Technique ◽  
Fuzzy C Means Algorithm

This paper introduces a new approach for on-line monitoring of drill wear states by using a fuzzy C-means algorithm. Experimental and simulation results have shown that drill wear conditions can be represented by four fuzzy grades. They are: “initial,” “small,” “normal,” and “severe.” The grade “severe” is proposed to be used as the prediction of tool replacement. This fuzzy technique is more adequate than conventional pattern recognition technqiues.

Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

1986 ◽  
Vol 44 ◽  
pp. 694-695
Author(s):  
G.Y. Fan ◽  
J.M. Cowley
Keyword(s):  
Image Processing ◽  
Pattern Recognition ◽  
Computer Software ◽  
Processing System ◽  
Light Level ◽  
Host Computer ◽  
Low Light ◽  
Image Processing System ◽  
Recent Developments ◽  
On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

Bayesian removal of noise for increased sensitivity in vector pattern recognition lattice imaging of interfaces

1993 ◽  
Vol 51 ◽  
pp. 994-995
Author(s):  
L. Fei ◽  
P. Fraundorf
Keyword(s):  
Pattern Recognition ◽  
Perfect Crystal ◽  
Unit Cell ◽  
Ion Milling ◽  
Beam Radiation ◽  
Major Interest ◽  
Unit Cells ◽  
Mapping Process ◽  
Increased Sensitivity ◽  
Electron Microscopes

Interface structure is of major interest in microscopy. With high resolution transmission electron microscopes (TEMs) and scanning probe microscopes, it is possible to reveal structure of interfaces in unit cells, in some cases with atomic resolution. A. Ourmazd et al. proposed quantifying such observations by using vector pattern recognition to map chemical composition changes across the interface in TEM images with unit cell resolution. The sensitivity of the mapping process, however, is limited by the repeatability of unit cell images of perfect crystal, and hence by the amount of delocalized noise, e.g. due to ion milling or beam radiation damage. Bayesian removal of noise, based on statistical inference, can be used to reduce the amount of non-periodic noise in images after acquisition. The basic principle of Bayesian phase-model background subtraction, according to our previous study, is that the optimum (rms error minimizing strategy) Fourier phases of the noise can be obtained provided the amplitudes of the noise is given, while the noise amplitude can often be estimated from the image itself.

Pattern Recognition: The Basis of All Cognition?

1989 ◽  
Vol 34 (11) ◽  
pp. 988-989
Author(s):  
Erwin M. Segal
Keyword(s):  
Pattern Recognition
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