An accelerated life testing model involving performance degradation

2004 ◽  
Author(s):  
Wenbiao Zhao ◽  
E.A. Elsayed
Keyword(s):  
Performance Degradation ◽  
Accelerated Life Testing ◽  
Life Testing ◽  
Testing Model ◽  
Accelerated Life

scholarly journals ACCELERATED LIFE TESTING WITH AN UNDERLYING THREE-PARAMETER WEIBULL MODEL

Engevista ◽  
2010 ◽  
Vol 7 (1) ◽  
Author(s):  
Daniel I. de Souza Jr. ◽  
Kamalesh Somani
Keyword(s):  
High Stress ◽  
Linear Acceleration ◽  
Weibull Model ◽  
Test Sample ◽  
Accelerated Life Testing ◽  
Life Testing ◽  
Distribution Models ◽  
Testing Model ◽  
Failure Data ◽  
Accelerated Life

The main objective of life testing is to obtain information concerning failure. This information should then be used in order to quantify reliability, improve product reliability, and to determine whether safety and reliability goals are being met. The amount of time available for testing directly at use conditions, that is, with practical test times and realistic (relatively) small test sample sizes, could be considerably less than the component’s expected lifetime. To overcome such a problem, there is the life-testing alternative aimed at forcing components to fail by testing them at much higher than the intended application conditions. By doing this, we will get failure data that can be fitted to life distribution models. To go from the failure rate obtained at high stress to what a product or service is likely to experience at much lower stress, under use conditions, we will need additional modeling. These models are known as acceleration models. The accelerated life testing concept is such that a component, operating under predetermined (correct) levels of increased stress, will have exactly the same failure mechanism as observed when used at normal stress levels. For example, if the time of testing is measured in cycles, then the time squeezing may only require increasing the number of cycles per unit of time. In this study, we will develop an accelerated life-testing model in which the underlying sampling distribution is the three-parameter Weibull model. We will be assuming a linear acceleration condition. An example will illustrate the application of the proposed accelerated life-testing model.  

Accelerated Life Testing Model of Laser Diodes under Space Radiation Stress

2014 ◽  
Vol 41 (5) ◽  
pp. 0502001
Author(s):  
刘韵 Liu Yun ◽  
赵尚弘 Zhao Shanghong ◽  
杨生胜 Yang Shengsheng ◽  
李勇军 Li Yongjun ◽  
强若馨 Qiang Ruoxin
Keyword(s):  
Laser Diodes ◽  
Space Radiation ◽  
Accelerated Life Testing ◽  
Life Testing ◽  
Radiation Stress ◽  
Testing Model ◽  
Accelerated Life
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