New burn-in methodology based on IC attributes, family IC burn-in data, and failure mechanism analysis
2021 ◽
Vol 1043
(4)
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pp. 042058
2013 ◽
Vol 473
◽
pp. 39-45
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2018 ◽
Vol 37
(2)
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pp. 683-690
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2015 ◽
Vol 51
(3)
◽
pp. 245-251
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