Monte-Carlo prediction of single-event characteristics of 65 nm CMOS SRAM under hundreds of MeV/n heavy-ions in space
2013 ◽
Vol 56
(6)
◽
pp. 1120-1125
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Keyword(s):
1985 ◽
Vol 32
(6)
◽
pp. 4189-4194
◽
2017 ◽
Vol 349
◽
pp. 589-603
◽
2010 ◽
Vol 2010
(HITEC)
◽
pp. 000077-000082
◽
2010 ◽
Vol 19
(05n06)
◽
pp. 1134-1140
◽
2010 ◽
Vol 86
(6)
◽
pp. 507-515
◽
Keyword(s):