Two-dimensional digital filtering

1975 ◽  
Vol 63 (4) ◽  
pp. 610-623 ◽  
Author(s):  
R.M. Mersereau ◽  
D.E. Dudgeon
1976 ◽  
Vol 23 (7) ◽  
pp. 405-414 ◽  
Author(s):  
R. Mersereau ◽  
W. Mecklenbrauker ◽  
T. Quatieri

1974 ◽  
Vol C-23 (9) ◽  
pp. 942-954 ◽  
Author(s):  
Ming-Duenn Ni ◽  
J.K. Aggarwal

Author(s):  
M. Wahl ◽  
F. C. F. Körber

AbstractA method has been developed to measure background corrected integrated intensities and their standard deviations from two-dimensional diffraction data without prior knowledge of the unit cell parameters or the crystal orientation. Ab initio spot detection and measurement are achieved by digital filtering and classification algorithms. Two test cases are presented showing that the method produces results which are comparable or better than those from standard processing programs.


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