Measurement of diffusion length and surface recombination velocity in semiconducting solids

S. Deb; M.K. Mukherjee; S. Dutta

doi:10.1109/proc.1968.6200

Measurement of diffusion length and surface recombination velocity in semiconducting solids

Proceedings of the IEEE ◽

10.1109/proc.1968.6200 ◽

1968 ◽

Vol 56 (1) ◽

pp. 133-134

Author(s):

S. Deb ◽

M.K. Mukherjee ◽

S. Dutta

Keyword(s):

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Recombination Velocity

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Mapping of Bulk Diffusion Length and Effective Back Surface Recombination Velocity in Silicon Solar Cells

2018 4th IEEE International Conference on Emerging Electronics (ICEE) ◽

10.1109/icee44586.2018.8937904 ◽

2018 ◽

Author(s):

Rajul Jain ◽

Siddharth Behera ◽

K. P. Sreejith ◽

Anil Kottantharayil ◽

Prabir Kanti Basu ◽

...

Keyword(s):

Solar Cells ◽

Diffusion Length ◽

Surface Recombination ◽

Bulk Diffusion ◽

Surface Recombination Velocity ◽

Silicon Solar Cells ◽

Back Surface ◽

Recombination Velocity

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Electron‐beam‐induced current determination of minority‐carrier diffusion length and surface recombination velocity in mercury‐cadmium‐telluride

Journal of Applied Physics ◽

10.1063/1.335225 ◽

1985 ◽

Vol 57 (8) ◽

pp. 2886-2891 ◽

Cited By ~ 9

Author(s):

B. E. Artz

Keyword(s):

Mercury Cadmium Telluride ◽

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Induced Current ◽

Minority Carrier Diffusion Length ◽

Electron Beam Induced Current ◽

Recombination Velocity

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Unambiguous distinction between diffusion length and surface recombination velocity of solar cells at different excitation levels

Journal of Applied Physics ◽

10.1063/1.370582 ◽

1999 ◽

Vol 85 (11) ◽

pp. 7764-7767 ◽

Cited By ~ 2

Author(s):

P. Wawer ◽

M. Rochel ◽

H.-G. Wagemann

Keyword(s):

Solar Cells ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Recombination Velocity

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Separation of bulk diffusion length and back surface recombination velocity by improved IQE-analysis

Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036) ◽

10.1109/pvsc.2000.915823 ◽

2002 ◽

Cited By ~ 6

Author(s):

M. Spiegel ◽

B. Fischer ◽

S. Keller ◽

E. Bucher

Keyword(s):

Diffusion Length ◽

Surface Recombination ◽

Bulk Diffusion ◽

Surface Recombination Velocity ◽

Back Surface ◽

Recombination Velocity

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Comment on ‘‘Evaluation of the minority carrier diffusion length and edge surface‐recombination velocity in GaAs p/n solar cells’’ [J. Appl. Phys. 72, 2919 (1992)]

Journal of Applied Physics ◽

10.1063/1.354502 ◽

1993 ◽

Vol 74 (5) ◽

pp. 3620-3621

Author(s):

Keung L. Luke

Keyword(s):

Solar Cells ◽

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Minority carrier diffusion length and edge surface-recombination velocity in InP

1993 (5th) International Conference on Indium Phosphide and Related Materials ◽

10.1109/iciprm.1993.380613 ◽

2002 ◽

Author(s):

R. Hakimzadeh ◽

S.G. Bailey

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Minority carrier diffusion length and edge surface‐recombination velocity in InP

Journal of Applied Physics ◽

10.1063/1.354936 ◽

1993 ◽

Vol 74 (2) ◽

pp. 1118-1123 ◽

Cited By ~ 13

Author(s):

Roshanak Hakimzadeh ◽

Sheila G. Bailey

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Diffusion length and surface recombination velocity measurements with the scanning electron microscope: The highly-doped emitter of a p-n junction

Solid-State Electronics ◽

10.1016/0038-1101(84)90093-5 ◽

1984 ◽

Vol 27 (1) ◽

pp. 59-67 ◽

Cited By ~ 11

Author(s):

D.E. Burk ◽

R. Sundaresan

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity ◽

Scanning Electron

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Correction to "Measurement of diffusion length, lifetime, and surface recombination velocity in thin semiconductor layers"

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1985.22306 ◽

1985 ◽

Vol 32 (11) ◽

pp. 2511-2512

Author(s):

F.N. Gonzalez ◽

A. Neugroschel

Keyword(s):

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Thin Semiconductor ◽

Recombination Velocity

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Measurement of diffusion length and surface recombination velocity in Interdigitated Back Contact (IBC) and Front Surface Field (FSF) solar cells

Physica B+C ◽

10.1016/0378-4363(85)90593-5 ◽

1985 ◽

Vol 129 (1-3) ◽

pp. 317-321

Author(s):

Pierre Verlinden ◽

Fernand Van de Wiele

Keyword(s):

Solar Cells ◽

Diffusion Length ◽

Surface Recombination ◽

Front Surface ◽

Surface Recombination Velocity ◽

Back Contact ◽

Surface Field ◽

Front Surface Field ◽

Recombination Velocity

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