The transfer characteristic of a linear phase detector when its input signal-noise ratio is small

The law of distribution of the output effect differs from the normal one at the output of the receiving path realized on the basis of autocorrelation algorithm with quadrature processing. When there is no signal at the input of the receiver, the distribution of the output effect corresponds to Rayleigh’s or Rayleigh – Rice’s law in condition of its presence. The probability density distribution at the output of an incoherent auto correlation receiver with quadrature processing is considered in relation to the input level of the energy-concealed phase-manipulated signal. In order to detect a useful signal it is necessary that, at the output of the receiver, the signal / noise ratio exceeds the detection threshold determined by the Neumann – Pearson criterion according to the given probability of false alarm. The level of the signal-to-noise ratio at the output of an incoherent autocorrelation receiver with quadrature processing has been calculated. A characteristic feature of the presented graphs is the linear dependence of the output signal / noise ratio relative to the input signal. This feature is observed in the input signal / noise ratio which is less than one. The curves for the distribution of the probability density of the input signal mix and noise corresponding to the generalized Rayleigh’s law (Rayleigh-Rice) are constructed in the book. There is a shift of curves for the abscissa axis according to the given probabilities of false alarms and accumulation time (observation). It is evident from the given graphs that the offset of the abscissa of the input signal value / noise ratio significantly depends on the accumulation of the input mixture time. The curves for detecting an energy-concealed phase-manipulated signal by a non-coherent autocorrelation receiver with quadrature processing on the basis of the probability density distribution are obtained. The results of the calculations indicate that detection of a phase-manipulated signal on the background of "white" noise is possible in case of an input-to-noise ratio of less than one, that is, up to -32 dB in real time (up to 0.1 s).

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Signal/Noise Ratio and Elemental Detectivity by Eels

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100054893 ◽

1982 ◽

Vol 40 ◽

pp. 488-489

Author(s):

R. F. Egerton

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Elemental Analysis ◽

Electron Energy Loss Spectroscopy ◽

Emission Spectroscopy ◽

X Ray ◽

Signal Noise ◽

Characteristic Signal ◽

Noise Ratio ◽

Electron Energy Loss

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

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Effect of a Nonlinear Tangential Converter on Estimation of the Signal/ Noise Ratio of a Binary Video Sequence

Telecommunications and Radio Engineering ◽

10.1615/telecomradeng.v62.i11.20 ◽

2004 ◽

Vol 62 (11) ◽

pp. 947-952

Author(s):

I. T. Rozhkov ◽

R. V. Dudorov

Keyword(s):

Video Sequence ◽

Signal Noise ◽

Noise Ratio

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ASSESSMENT OF THE SIGNAL/NOISE RATIO IN A BINARY SIGNAL

Telecommunications and Radio Engineering ◽

10.1615/telecomradeng.v71.i5.60 ◽

2012 ◽

Vol 71 (5) ◽

pp. 445-453

Author(s):

M. D. Rasnikov ◽

I. T. Rozhkov

Keyword(s):

Signal Noise ◽

Binary Signal ◽

Noise Ratio

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Case Study of Electro-Optical Probing Signal with High Signal-Noise Ratio

ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2019p0123 ◽

2019 ◽

Author(s):

Ryan Xiao ◽

William Wang ◽

Ang Li ◽

Shengqiu Xu ◽

Binghai Liu

Keyword(s):

Failure Mode ◽

High Signal ◽

Signal Noise ◽

Electrical Failure ◽

Current Path ◽

Probing Signal ◽

Optical Probing ◽

Noise Ratio ◽

Case Collection

Abstract With the development of semiconductor technology and the increment quantity of metal layers in past few years, backside EFA (Electrical Failure Analysis) technology has become the dominant method. In this paper, abnormally high Signal Noise Ratio (SNR) signal captured by Electro-Optical Probing (EOP)/Laser Voltage Probing (LVP) from backside is shown and the cause of these phenomena are studied. Based on the real case collection, two kinds of failure mode are summarized, and simulated experiments are performed. The results indicate that when a current path from power to ground is formed, the high SNR signal can be captured at the transistor which was on this current path. It is helpful of this consequence for FA to identify the failure mode by high SNR signal.

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