Correction to "Electro-optic light beam deflector"

1964 ◽  
Vol 52 (7) ◽  
pp. 862-862 ◽  
Author(s):  
V.J. Fowler ◽  
C.F. Buhrer ◽  
L.R. Bloom
Keyword(s):  
Light Beam ◽  
Electro Optic

scholarly journals Tunable lateral shift and polarization beam splitting of the transmitted light beam through electro-optic crystals

2008 ◽  
Vol 104 (12) ◽  
pp. 123101 ◽  
Author(s):  
Xi Chen ◽  
Ming Shen ◽  
Zhen-Fu Zhang ◽  
Chun-Fang Li
Keyword(s):  
Light Beam ◽  
Lateral Shift ◽  
Transmitted Light ◽  
Beam Splitting ◽  
Electro Optic

scholarly journals Precise Method for Measuring the Quadratic Electro-Optic Effect in Noncentrosymmetric Crystals in the Presence of Natural Birefringence

Materials ◽  
2020 ◽  
Vol 13 (18) ◽  
pp. 3942
Author(s):  
Marek Izdebski ◽  
Rafał Ledzion ◽  
Włodzimierz Kucharczyk
Keyword(s):  
Phase Transition ◽  
Transition Temperature ◽  
Light Beam ◽  
Phase Transition Temperature ◽  
Optical Axis ◽  
Quadratic Effect ◽  
Precise Method ◽  
Linear Effect ◽  
Electro Optic ◽  
Adp Crystal

The application of the improved dynamic polarimetric method for the measurement of the quadratic electro-optic effect in NH4H2PO4 (ADP) crystal with the light beam propagating perpendicularly to its optical axis is presented. This technique can be applied in noncetrosymmetric crystals in the presence of natural birefringence even when the fast and slow rays diverge slightly, causing them to only partially interfere. The method allows for minor errors in cutting and orientation of the crystal samples, resulting in deviations from configurations in which the crystal symmetry vetoes the linear electro-optic effect. The occurring contribution of the linear effect, if it is not too large, not only does not exclude the measurement of the quadratic effect, but increases its accuracy. The method does not require any prior compensation for the natural birefringence. Its sensitivity allows for quadratic electro-optic effect measurements in ferroelectrics in temperatures significantly different from the phase transition temperature or in paraelectric crystals, for which this effect is relatively small.

An electro-optic light-beam deflector

1966 ◽  
Author(s):  
W.P. Brown ◽  
J.E. Kiefer ◽  
J.F. Lotspeich ◽  
H.R. Senf
Keyword(s):  
Light Beam ◽  
Electro Optic

scholarly journals Monochromatic Depolarizer Based on Liquid Crystal

Crystals ◽  
2019 ◽  
Vol 9 (8) ◽  
pp. 387 ◽  
Author(s):  
Paweł Marć ◽  
Noureddine Bennis ◽  
Anna Spadło ◽  
Aleksandra Kalbarczyk ◽  
Rafał Węgłowski ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Light Beam ◽  
Optical Measurements ◽  
Degree Of Polarization ◽  
Optical Elements ◽  
Electro Optic ◽  
Spatial And Temporal Changes ◽  
Time Domains ◽  
Vertically Aligned ◽  
Set Up

Polarization is a very useful parameter of a light beam in many optical measurements. Improvement of holographic systems requires optical elements which need a diffused and depolarized light beam. This paper describes a simple monochromatic depolarizer based on a pure vertically aligned liquid crystal without pretilt. In this work we present an extended description of depolarizer by analyzing its electro-optic properties measured in spatial and time domains with the use of crossed polarizers and polarimetric configurations. Crossed polarizers set-up provides information on spatial and temporal changes of microscopic textures while polarimetric measurement allows to measure voltage and time dependence of degree of polarization. Three different thicknesses, i.e., 5 μm, 10 μm and 15 μm have been manufactured in order to analyze another degree of freedom for this type of depolarizer device based on a liquid crystals’ material. Consideration of the light scattering capability of the cell is reported.

Electro-optic light beam deflector

1964 ◽  
Vol 52 (2) ◽  
pp. 193-194 ◽  
Author(s):  
V.J. Fowler ◽  
C.F. Buhrer ◽  
L.R. Bloom
Keyword(s):  
Light Beam ◽  
Electro Optic

scholarly journals Development of an Electro-Optic Scanner for Potential Endoscope Application

2009 ◽  
Vol 3 (2) ◽  
Author(s):  
W. Wang ◽  
S. Lee ◽  
A. Jen ◽  
P. Reinhall ◽  
D. Nuckley
Keyword(s):  
Light Beam ◽  
Optical Fibers ◽  
Imaging System ◽  
Biological Tissues ◽  
Index Of Refraction ◽  
Beam Deflection ◽  
Image Size ◽  
Remote Imaging ◽  
Horizontal Beam ◽  
Electro Optic

Technological advancements in endoscopy design are in current development due to the increased demand for minimally invasive medical procedures. One such advancement is reducing the overall size of the endoscope system while maintaining the resolution and field-of-view (FOV). Reduction of size results in less tissue damage and trauma during operation as well as faster recovery times for patients. Additionally, areas that are inaccessible by today's endoscope designs will be possible to examine. Current endoscopes use either a bundle of optical fibers (optical waveguides) and/or one or more cameras having an array of detectors to capture an image. Thus, the diameter of these devices employed for remote imaging cannot be reduced to smaller than the image size. Even if one ignores additional optical fibers used for illumination of a region of interest, the scope diameter is therefore limited by the individual pixel size of a camera or by the diameter of optical fibers used to acquire the image. Therefore, it is apparent to achieve scopes with less than 3 mm overall diameter using current technologies, resolution and/or FOV must be sacrificed by having fewer pixel elements. All commercially available scopes suffer from this fundamental tradeoff between high image quality and small size. More recently, our research has been working on developing a 2-D electro-optic scanner potentially be implemented for clinical endoscopic imaging application. The proposed optical device has several unique advantages. Electro-optical scanning offers a sensitive, facile, accurate, and superb quality method to capture images of physical and biological tissues. In addition, the minute physical size of the imaging system has a much needed advantage over conventional imaging systems. The proposed design is based on the fact that the propagation direction of a light beam can be changed when the index of refraction of an electro-optic medium is altered by the application of an external electric field. The basic design of the system consists of a thin film electro-optic polymer waveguide with built-in cascaded prisms structure for horizontal beam deflection and an electro-optic grating structure for vertical beam deflection. The cascaded prisms are combined with the electro-optic polymer to create a voltage-controlled horizontal beam deflection. A grating coupler, a structure that is commonly used as light coupling device for dielectric waveguide, is combined with the EO polymer to create the vertical controlled beam deflection. A collimated light beam coupled into the waveguide by a mechanical coupler via an optical fiber cascaded down these two deflection stages. When the beam exits, the emitted light beam is displaced along two orthogonal directions in a raster pattern. A photodetector array integrated in the same substrate captured the reflected intensity. The scanned imaged is then analyzed and reconstruct based on the received signal.

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