Analysis of sneak paths and sense-line distortion in an improved capacitor read-only memory

1963 ◽  
Vol 51 (11) ◽  
pp. 1554-1569 ◽  
Author(s):  
D.M. Taub
Keyword(s):  
Sensors ◽  
2021 ◽  
Vol 21 (5) ◽  
pp. 1700
Author(s):  
Anca Mihaela Vasile (Dragan) ◽  
Alina Negut ◽  
Adrian Tache ◽  
Gheorghe Brezeanu

An EEPROM (electrically erasable programmable read-only memory) reprogrammable fuse for trimming a digital temperature sensor is designed in a 0.18-µm CMOS EEPROM. The fuse uses EEPROM memory cells, which allow multiple programming cycles by modifying the stored data on the digital trim codes applied to the thermal sensor. By reprogramming the fuse, the temperature sensor can be adjusted with an increased trim variation in order to achieve higher accuracy. Experimental results for the trimmed digital sensor showed a +1.5/−1.0 ℃ inaccuracy in the temperature range of −20 to 125 ℃ for 25 trimmed DTS samples at 1.8 V by one-point calibration. Furthermore, an average mean of 0.40 ℃ and a standard deviation of 0.70 ℃ temperature error were obtained in the same temperature range for power supply voltages from 1.7 to 1.9 V. Thus, the digital sensor exhibits similar performances for the entire power supply range of 1.7 to 3.6 V.


1965 ◽  
Author(s):  
P. S. Sidhu ◽  
B. Bussell
Keyword(s):  

1973 ◽  
Vol 9 (25) ◽  
pp. 580
Author(s):  
Chang Tien-Lin
Keyword(s):  

2001 ◽  
Vol 40 (Part 1, No. 3B) ◽  
pp. 1704-1710 ◽  
Author(s):  
Seiji Kobayashi ◽  
Hisayuki Yamatsu ◽  
Yoshihiro Takemoto
Keyword(s):  

2007 ◽  
Vol 46 (6B) ◽  
pp. 3898-3901 ◽  
Author(s):  
Kazuma Kurihara ◽  
Yuzo Yamakawa ◽  
Takayuki Shima ◽  
Junji Tominaga

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