A Diagnostic Fault Simulation Method for a Single Universal Logical Fault Model

2017 ◽  
Author(s):  
Toshinori Hosokawa ◽  
Hideyuki Takano ◽  
Hiroshi Yamazaki ◽  
Koji Yamazaki
Keyword(s):  
Fault Simulation ◽  
Simulation Method ◽  
Fault Model

An effective fault simulation method for core based LSI

2002 ◽  
Author(s):  
T. Yoshida ◽  
R. Shimoda ◽  
T. Mizokawa ◽  
K. Hirayama
Keyword(s):  
Fault Simulation ◽  
Simulation Method

scholarly journals Test

2021 ◽  
pp. 381-391
Author(s):  
Peter Marwedel
Keyword(s):  
Physical System ◽  
Fault Tolerant ◽  
Fault Injection ◽  
Fault Simulation ◽  
Fault Coverage ◽  
Fault Model ◽  
Pattern Generation ◽  
Signature Analysis ◽  
Fault Tolerant Systems ◽  
Random Patterns

AbstractUnfortunately, we cannot rely on designed and possibly already manufactured systems to operate as expected. These systems may have become defective during their use, or their function may have been compromised during the fabrication or their design. The purpose of testing is to verify whether or not an existing embedded/cyber-physical system can be operated as expected. In this chapter, we will present fundamental terms and techniques for testing. There will be a brief introduction to the aims of test pattern generation and their application. We will be introducing terms such as fault model, fault coverage, fault simulation, and fault injection. Also, we will be presenting techniques which improve testability, including the generation of pseudo-random patterns, and signature analysis. It would be beneficial to consider testability issues already during design. In case of fault-tolerant systems, resilience must be verified.

Sign in / Sign up

Export Citation Format

Share Document