X-ray temporal, spatial and spectral study of 0.9 MA X-pinch Ti, Fe, Mo, W and Pt radiation sources. Energetic electron beam and hard X-ray generation

2002 ◽  
Author(s):  
V.L. Kantsyrev ◽  
A.S. Shlyaptseva ◽  
B.S. Bauer ◽  
D.A. Fedin ◽  
R. Presura ◽  
...  
Keyword(s):  
Electron Beam ◽  
Spectral Study ◽  
Energetic Electron ◽  
X Ray ◽  
Radiation Sources

scholarly journals Perspectives towards Sub-Ångström Working Regime of the European X-ray Free-Electron Laser with Low-Emittance Electron Beams

2021 ◽  
Vol 11 (22) ◽  
pp. 10768
Author(s):  
Ye Chen ◽  
Frank Brinker ◽  
Winfried Decking ◽  
Matthias Scholz ◽  
Lutz Winkelmann
Keyword(s):  
Electron Beam ◽  
Photon Energy ◽  
Free Electron ◽  
Free Electron Laser ◽  
Electron Beams ◽  
Energy Levels ◽  
Energetic Electron ◽  
X Rays ◽  
X Ray ◽  
Low Emittance

Sub-ångström working regime refers to a working state of free-electron lasers which allows the generation of hard X-rays at a photon wavelength of 1 ångström and below, that is, a photon energy of 12.5 keV and above. It is demonstrated that the accelerators of the European X-ray Free-Electron Laser can provide highly energetic electron beams of up to 17.5 GeV. Along with long variable-gap undulators, the facility offers superior conditions for exploring self-amplified spontaneous emission (SASE) in the sub-ångström regime. However, the overall FEL performance relies quantitatively on achievable electron beam qualities through a kilometers-long accelerator beamline. Low-emittance electron beam production and the associated start-to-end beam physics thus becomes a prerequisite to dig in the potentials of SASE performance towards higher photon energies. In this article, we present the obtained results on electron beam qualities produced with different accelerating gradients of 40 MV/m–56 MV/m at the cathode, as well as the final beam qualities in front of the undulators via start-to-end simulations considering realistic conditions. SASE studies in the sub-ångström regime, using optimized electron beams, are carried out at varied energy levels according to the present state of the facility, that is, a pulsed mode operating with a 10 Hz-repetition 0.65 ms-long bunch train energized to 14 GeV and 17.5 GeV. Millijoule-level SASE intensity is obtained at a photon energy of 25 keV at 14 GeV electron beam energy using a gain length of about 7 m. At 17.5 GeV, half-millijoule lasing is achieved at 40 keV. Lasing at up to 50 keV is demonstrated with pulse energies in the range of a few hundreds and tens of microjoules with existing undulators and currently achievable electron beam qualities.

scholarly journals Compton Sources of Electromagnetic Radiation

2010 ◽  
Vol 03 (01) ◽  
pp. 147-163 ◽  
Author(s):  
Geoffrey A. Krafft ◽  
Gerd Priebe
Keyword(s):  
Electron Beam ◽  
Electromagnetic Radiation ◽  
Laser Light ◽  
Review Article ◽  
X Ray ◽  
Large Numbers ◽  
Radiation Sources ◽  
The World ◽  
Beam Motion ◽  
Polarized Photons

When a relativistic electron beam interacts with a high-field laser beam, intense and highly collimated electromagnetic radiation will be generated through Compton scattering. Through relativistic upshifting and the relativistic Doppler effect, highly energetic polarized photons are radiated along the electron beam motion when the electrons interact with the laser light. For example, X-ray radiation can be obtained when optical lasers are scattered from electrons of tens-of-MeV beam energy. Because of the desirable properties of the radiation produced, many groups around the world have been designing, building, and utilizing Compton sources for a wide variety of purposes. In this review article, we discuss the generation and properties of the scattered radiation, the types of Compton source devices that have been constructed to date, and the prospects of radiation sources of this general type. Due to the possibilities of producing hard electromagnetic radiation in a device that is small compared to the alternative storage ring sources, it is foreseen that large numbers of such sources may be constructed in the future.

scholarly journals Hard X-ray nanofocusing at low-emittance synchrotron radiation sources

2014 ◽  
Vol 21 (5) ◽  
pp. 996-1005 ◽  
Author(s):  
Christian G. Schroer ◽  
Gerald Falkenberg
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Storage Ring ◽  
Source Parameters ◽  
Gaussian Model ◽  
Scanning Microscopy ◽  
X Ray ◽  
Radiation Sources ◽  
Central Cone ◽  
Low Emittance

X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is modeled in terms of size, flux and coherence. The beam properties are expressed in terms of the emittances of the storage ring and the lateral sizes of the electron beam. Optimal source parameters are calculated to obtain efficient and diffraction-limited nanofocusing. With decreasing emittance, the usable fraction of the beam for diffraction-limited nanofocusing experiments can be increased by more than two orders of magnitude compared with modern storage ring sources. For a diffraction-limited storage ring, nearly the whole beam can be focused, making these sources highly attractive for X-ray scanning microscopy.

Energetic electron beam generation and anisotropy of hard x-ray emission from 0.9 to 1.0 MA high-Z X pinches

2003 ◽  
Vol 10 (6) ◽  
pp. 2519-2526 ◽  
Author(s):  
V. L. Kantsyrev ◽  
D. A. Fedin ◽  
A. S. Shlyaptseva ◽  
S. Hansen ◽  
D. Chamberlain ◽  
...  
Keyword(s):  
Electron Beam ◽  
Energetic Electron ◽  
X Ray ◽  
Electron Beam Generation ◽  
Beam Generation

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

X-ray micro tomography in the scanning electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 106-107 ◽  
Author(s):  
W. Brünger
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Target Surface ◽  
The Body ◽  
X Rays ◽  
Cross Sectional ◽  
X Ray ◽  
Micro Tomography ◽  
Scanning Electron

Reconstructive tomography is a new technique in diagnostic radiology for imaging cross-sectional planes of the human body /1/. A collimated beam of X-rays is scanned through a thin slice of the body and the transmitted intensity is recorded by a detector giving a linear shadow graph or projection (see fig. 1). Many of these projections at different angles are used to reconstruct the body-layer, usually with the aid of a computer. The picture element size of present tomographic scanners is approximately 1.1 mm2.Micro tomography can be realized using the very fine X-ray source generated by the focused electron beam of a scanning electron microscope (see fig. 2). The translation of the X-ray source is done by a line scan of the electron beam on a polished target surface /2/. Projections at different angles are produced by rotating the object.During the registration of a single scan the electron beam is deflected in one direction only, while both deflections are operating in the display tube.

Searching for the causes why some of the paintings by Mihaly Munkacsy are darkening

1990 ◽  
Vol 48 (2) ◽  
pp. 204-205
Author(s):  
Imre Pozsgai ◽  
Klara Erdöhalmi-Torok
Keyword(s):  
Electron Beam ◽  
Cross Section ◽  
Polyester Resin ◽  
National Gallery ◽  
X Ray ◽  
Art Historians ◽  
Made In ◽  
Grinding And Polishing

The paintings by the great Hungarian master Mihaly Munkacsy (1844-1900) made in an 8-9 years period of his activity are deteriorating. The most conspicuous sign of the deterioration is an intensive darkening. We have made an attempt by electron beam microanalysis to clarify the causes of the darkening. The importance of a study like this is increased by the fact that a similar darkening can be observed on the paintings by Munkacsy’s contemporaries e.g Courbet and Makart. A thick brown mass the so called bitumen used by Munkacsy for grounding and also as a paint is believed by the art historians to cause the darkening.For this study, paint specimens were taken from the following paintings: “Studio”, “Farewell” and the “Portrait of the Master’s Wife”, all of them are the property of the Hungarian National Gallery. The paint samples were embedded in a polyester resin “Poly-Pol PS-230” and after grinding and polishing their cross section was used for x-ray mapping.

Electron Beam-Induced Mass Loss in Freeze-Dried Tissue and Protein Samples

1985 ◽  
Vol 43 ◽  
pp. 470-471
Author(s):  
M.E. Cantino ◽  
M.K. Goddard ◽  
L.E. Wilkinson ◽  
D.E. Johnson
Keyword(s):  
Electron Beam ◽  
Salivary Gland ◽  
Mass Loss ◽  
Counting Rate ◽  
Dose Dependence ◽  
X Ray ◽  
Large Samples ◽  
Freeze Dried ◽  
Muscle Homogenate ◽  
Large Muscle

Quantification in biological x-ray microanalysis depends on accurate evaluation of mass loss. Although several studies have addressed the problem of electron beam induced mass loss from organic samples (eg., 1,2). uncertainty persists as to the dose dependence, the extent of loss, the elemental constituents affected, and the variation in loss for different materials and tissues. in the work described here, we used x-ray counting rate changes to measure mass loss in albumin (used as a quantification standard), salivary gland, and muscle.In order to measure mass loss at low doses (10-4 coul/cm2 ) large samples were needed. While freeze-dried salivary gland sections of the required dimensions were available, muscle sections of this size were difficult to obtain. To simulate large muscle sections, frog or rat muscle homogenate was injected between formvar films which were then stretched over slot grids and freeze-dried. Albumin samples were prepared by a similar procedure. using a solution of bovine serum albumin in water. Samples were irradiated in the STEM mode of a JEOL 100C.

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