The determination of the electron beam energy in DM1 with far field X-ray measurements

2002 ◽  
Author(s):  
J.E. Rauch ◽  
J.R. Thompson
Keyword(s):  
Electron Beam ◽  
Beam Energy ◽  
Far Field ◽  
Electron Beam Energy ◽  
X Ray

Soft-X-ray spectra of highly charged Au ions in an electron-beam ion trap

2001 ◽  
Vol 79 (2-3) ◽  
pp. 153-162 ◽  
Author(s):  
E Träbert ◽  
P Beiersdorfer ◽  
K B Fournier ◽  
S B Utter ◽  
K L Wong
Keyword(s):  
Electron Beam ◽  
Beam Energy ◽  
Large Scale ◽  
Ion Trap ◽  
Electron Beam Energy ◽  
X Ray ◽  
Maximum Charge ◽  
Electron Beam Ion Trap ◽  
Atomic Structure Calculations ◽  
Structure Calculations

Systematic variation of the electron-beam energy in an electron-beam ion trap has been employed to produce soft-X-ray spectra (20 to 60 Å) of Au with well-defined maximum charge states ranging from Br- to Co-like ions. Guided by large-scale relativistic atomic structure calculations, the strongest Δn = 0 (n = 4 to n' = 4) transitions in Rb- to Cu-like ions (Au42+ – Au50+) have been identified. PACS Nos.: 32.30Rj, 39.30+w, 31.50+w, 32.20R

A Universal Equation for the Emission Range of X Rays from Bulk Specimens

2007 ◽  
Vol 13 (5) ◽  
pp. 354-357 ◽  
Author(s):  
Raynald Gauvin
Keyword(s):  
Electron Beam ◽  
Free Path ◽  
Beam Energy ◽  
Mean Free Path ◽  
Electron Beam Energy ◽  
X Rays ◽  
Bulk Materials ◽  
Universal Equation ◽  
Electron Trajectories ◽  
X Ray

The derivation of a universal equation to compute the range of emitted X rays is presented for homogeneous bulk materials. This equation is based on two fundamental assumptions: the φ(ρz) curve of X-ray generation is constant and the ratio of the emitted to the generated X-ray range is equal to the ratio of the emitted to the generated X-ray intensity. An excellent agreement is observed with data obtained from Monte Carlo simulations of 200,000 electron trajectories in C, Al, Cu, Ag, Au, and an Fe–B alloy with boron weight fractions equal to 0.01, 0.1, 0.2, 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, 0.9, and 0.99, performed with the electron beam energy varied from 1 to 30 keV in 1-keV steps. When the ratio of the generated X-ray range to the photon mean free path is much smaller than one, the emission X-ray range is equal to the generated X-ray range, but when this ratio is much greater than one, the emission X-ray range is constant and is given by the product of the effective photon mean free path multiplied by the sine of the take-off angle.

X-ray microanalysis of uranium dioxide particles by using low electron beam energy

2014 ◽  
Vol 78 (9) ◽  
pp. 851-853 ◽  
Author(s):  
V. G. Dyukov ◽  
E. N. Evstaf’eva ◽  
V. A. Stebelkov ◽  
A. A. Tatarintsev ◽  
V. V. Khoroshilov
Keyword(s):  
Electron Beam ◽  
Uranium Dioxide ◽  
Beam Energy ◽  
Electron Beam Energy ◽  
X Ray

scholarly journals Compensating the electron beam energy spread by the natural transverse gradient of laser undulator in all-optical x-ray light sources

2014 ◽  
Vol 22 (11) ◽  
pp. 13880 ◽  
Author(s):  
Tong Zhang ◽  
Chao Feng ◽  
Haixiao Deng ◽  
Dong Wang ◽  
Zhimin Dai ◽  
...  
Keyword(s):  
Electron Beam ◽  
Beam Energy ◽  
Energy Spread ◽  
Light Sources ◽  
Electron Beam Energy ◽  
X Ray ◽  
All Optical ◽  
Transverse Gradient ◽  
Natural Transverse

Determination of the noncharging electron‐beam energy on insulators

1992 ◽  
Vol 71 (6) ◽  
pp. 2871-2876 ◽  
Author(s):  
P. Girard ◽  
P. Charpenel ◽  
H. Martin
Keyword(s):  
Electron Beam ◽  
Beam Energy ◽  
Electron Beam Energy

scholarly journals A soft X-ray free-electron laser beamline at SACLA: the light source, photon beamline and experimental station

2018 ◽  
Vol 25 (1) ◽  
pp. 282-288 ◽  
Author(s):  
Shigeki Owada ◽  
Kazuaki Togawa ◽  
Takahiro Inagaki ◽  
Toru Hara ◽  
Takashi Tanaka ◽  
...  
Keyword(s):  
Electron Beam ◽  
Pulse Energy ◽  
Free Electron ◽  
Free Electron Laser ◽  
Beam Energy ◽  
Electron Beam Energy ◽  
X Ray ◽  
Experimental Station ◽  
And Performance ◽  
Source Test

The design and performance of a soft X-ray free-electron laser (FEL) beamline of the SPring-8 Compact free-electron LAser (SACLA) are described. The SPring-8 Compact SASE Source test accelerator, a prototype machine of SACLA, was relocated to the SACLA undulator hall for dedicated use for the soft X-ray FEL beamline. Since the accelerator is operated independently of the SACLA main linac that drives the two hard X-ray beamlines, it is possible to produce both soft and hard X-ray FEL simultaneously. The FEL pulse energy reached 110 µJ at a wavelength of 12.4 nm (i.e.photon energy of 100 eV) with an electron beam energy of 780 MeV.

X-Ray Microanalysis of Metallic Thin Films

2005 ◽  
Author(s):  
F. L. Ng ◽  
J. Wei
Keyword(s):  
Electron Beam ◽  
Beam Energy ◽  
Atomic Weight ◽  
Metallic Thin Films ◽  
Electron Beam Energy ◽  
Si Substrate ◽  
X Ray ◽  
Probe Current ◽  
Au Film ◽  
Critical Excitation

Nickel and gold films are widely used for microsystems fabrication and packaging, as well as under bump metallization. In this paper, x-ray microanalysis was used to measure the thickness of Ni and Au films. Au and Ni films with varied thicknesses were deposited on silicon (Si) substrate by magnetron sputtering method. Incremental electron beam energy ranging from 4 keV to 30 keV was applied while other parameters were kept constant to determine the electron beam energy required to penetrate the metallic films. The effects of probe current at a fixed electron beam energy on the penetration depth were investigated too. With higher energy applied, the electron beam can penetrate deeper and more Si signal can be detected. The Ni and Au film thicknesses almost have linear relationship with the required penetration electron beam energy. The probe current has minimal effect on the specimen once it has reached the critical excitation probe current. For Ni and Au films with same thickness, higher energy or probe current is needed to penetrate the Au film to reach Si substrate due to the higher Au atomic weight.

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