scholarly journals Ion beam surface treatment: a new technique for thermally modifying surfaces using intense, pulsed ion beams

2002 ◽  
Author(s):  
R.W. Stinnett ◽  
R.G. Buchheit ◽  
E.L. Neau ◽  
M.T. Crawford ◽  
K.P. Lamppa ◽  
...  
Keyword(s):  
Surface Treatment ◽  
Ion Beam ◽  
Ion Beams ◽  
New Technique ◽  
Beam Surface ◽  
A New Technique

Plasma and ion beam surface treatment of polyethylene

1995 ◽  
Vol 74-75 ◽  
pp. 689-695 ◽  
Author(s):  
N. Sprang ◽  
D. Theirich ◽  
J. Engemann
Keyword(s):  
Surface Treatment ◽  
Ion Beam ◽  
Beam Surface

A new technique for diagnosing multicharged ion beams produced by ECR ion source

2004 ◽  
Vol 75 (5) ◽  
pp. 1539-1541
Author(s):  
Z. M. Zhang ◽  
H. W. Zhao ◽  
Y. Cao ◽  
L. Ma ◽  
B. H. Ma ◽  
...  
Keyword(s):  
Ion Beams ◽  
Ion Source ◽  
New Technique ◽  
Ecr Ion Source ◽  
A New Technique

scholarly journals Structure of the near-surface layer of NiTi on the meso- and microscale levels after ion-beam surface treatment

2014 ◽  
Author(s):  
L. L. Meisner ◽  
T. M. Poletika ◽  
S. N. Meisner ◽  
A. V. Tverdichlebova ◽  
S. L. Girsova ◽  
...  
Keyword(s):  
Surface Layer ◽  
Surface Treatment ◽  
Ion Beam ◽  
Near Surface ◽  
Beam Surface

A New Technique For Visualizing The Displacement Field Of Indentations: The Case Of A Soft Film On A Hard Substrate

1997 ◽  
Vol 505 ◽  
Author(s):  
Joost J. Vlassak ◽  
T. Y. Tsui ◽  
W. D. Nix
Keyword(s):  
Titanium Nitride ◽  
Displacement Field ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Grain Structure ◽  
New Technique ◽  
Hard Substrate ◽  
Film Material ◽  
Pile Up ◽  
A New Technique

ABSTRACTWe have developed a new technique for visualizing displacement fields of indentations in thin films. In this technique, the indented film consists of alternating layers of two different materials. One of the materials serves as a marker for visualizing the plastic flow induced by the indentation. Focused Ion Beam (FIB) milling is used to cross-section the indentation, revealing the deformed layers. This technique can be used to study how the presence of the substrate affects the plastic displacement field around the indentation. The technique is applied to a multilayered film of aluminum and titanium nitride on a silicon substrate. The titanium nitride layers are much thinner than the aluminum layers and serve the function of marker. Pile-up of the film material around the indenter and the effect of the hard substrate are easily revealed and a mechanism for pile-up is suggested. The technique also shows that the grain structure in the deformed zone around the indentation is altered profoundly.

scholarly journals Ion-beam surface treatment: a new capability for rapid melt and resolidification of surfaces

1994 ◽  
Author(s):  
Regan W. Stinnett ◽  
D. C. McIntyre ◽  
R. G. Buchheit ◽  
John B. Greenly ◽  
Michael O. Thompson
Keyword(s):  
Surface Treatment ◽  
Ion Beam ◽  
Beam Surface
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