Correction method of testability verification test plan for electronic product based on physics of failure

2016 ◽  
Author(s):  
Chen Chen ◽  
Zhao-Yang Zeng ◽  
Jue-yi Jiang ◽  
Xiao-Long Ma
Keyword(s):  
Correction Method ◽  
Test Plan ◽  
Physics Of Failure ◽  
Electronic Product ◽  
Verification Test

scholarly journals Characteristics of Scale Models of Large Deployable Mesh Reflector Antennas and Study on Space Verification Test Plan.

1992 ◽  
Vol 40 (467) ◽  
pp. 667-673
Author(s):  
Takashi EBISUI ◽  
Akio ISO ◽  
Teruaki ORIKASA ◽  
Toshio SUGIMOTO ◽  
Teruki OKAMOTO ◽  
...  
Keyword(s):  
Test Plan ◽  
Reflector Antennas ◽  
Scale Models ◽  
Verification Test

Building a verification test plan: trading brute force for finesse

2006 ◽  
Author(s):  
F. Bacchini ◽  
S. Malik ◽  
J. Bergeron ◽  
H. Foster ◽  
A. Piziali ◽  
...  
Keyword(s):  
Brute Force ◽  
Test Plan ◽  
Verification Test

Building a verification test plan

2006 ◽  
Author(s):  
J. Bergeron ◽  
H. Foster ◽  
A. Piziali ◽  
R. S. Mitra ◽  
C. Ahlschlager ◽  
...  
Keyword(s):  
Test Plan ◽  
Verification Test

Application of Physics of Failure Method in Reliability Design of Electronic Products

2010 ◽  
Vol 44-47 ◽  
pp. 819-823 ◽  
Author(s):  
Jiang Shao ◽  
Cheng Hui Zeng ◽  
Yong Hong Li
Keyword(s):  
Modeling And Simulation ◽  
Reliability Theory ◽  
Simulation Methods ◽  
Engineering Analysis ◽  
Prevention Measures ◽  
Physics Of Failure ◽  
Electronic Products ◽  
Reliability Design ◽  
Analysis Techniques ◽  
Electronic Product

Based on reliability theory on physics of failure, reliability information of electronic products is predicted by modeling and simulation methods. Various engineering analysis techniques are utilized and the product’s reliability is analyzed and designed. Analysis results on an electronic product example show that physics of failure method can find week problems of reliability design, advance prevention measures, mend the design to eliminate potential faults, thus improve the inherent reliability of electronic product ultimately.

Reliability of an Electronic Product Fabricated of Mass-Produced Components

2018 ◽  
Vol 2018 (1) ◽  
pp. 000337-000343
Author(s):  
E. Suhir
Keyword(s):  
Failure Rate ◽  
Favorable Effect ◽  
Irreversible Processes ◽  
Physics Of Failure ◽  
Electronic Products ◽  
Electronic Product ◽  
Long Time ◽  
Normal Law ◽  
Future Work ◽  
Product Manufacturer

Abstract Bathtub curve (BTC), the reliability “passport” of an electronic product, is affected by two major irreversible processes: the decreasing with time statistics-related failure rate (SFR) process and increasing with time physics-of-failure-related failure rate (PFR) process. The first process dominates at the infant-mortality portion (IMP) of the curve and the second one – at its wear-out portion (WOP). For many electronic products these two processes compensate for each other at the BTC's steady-state portion. The SFR process can be predicted theoretically for products comprised of mass-produced components, i.e., for typical electronic products. This could be done assuming that the failure rates of the components received by an electronic product manufacturer from various and numerous vendors can be viewed as random variables distributed between zero and infinity and that the SFR and PFR processes are statistically independent. The predicted non-random SFR depends, of course, on the particular probability distribution function (PDF) of the random SFRs of its components. Two PDFs for the components' random SFR have been considered in this analysis: normal (Gaussian) and Rayleigh. The normal law turned out to be more conservative: it led to a slower decrease in the SFR of the product than the Rayleigh law. Future work should include the investigation into the most realistic distributions of the random SFR for the most critical and the most vulnerable components obtained from major vendors of the particular manufacturer, particular products and applications. The computed data indicate that the decrease in the resulting failure rate at the WOP of the BTC because of the favorable effect of the decrease of the non-random SFR with time can be appreciable for highly reliable products expected to function for a long time.

scholarly journals NRT Design Verification Test Plan.

2018 ◽  
Author(s):  
Christopher Lee Kelley ◽  
Brian Thomas Naughton
Keyword(s):  
Design Verification ◽  
Test Plan ◽  
Verification Test

Ortho-k lenses fitting in patients with “non-typical” corneas

The Eye ◽  
2020 ◽  
Vol 22 (129) ◽  
pp. 22-29
Author(s):  
Svetlana Kravchuk ◽  
Olga Zhabina
Keyword(s):  
Correction Method ◽  
Diameter Ratio ◽  
Corneal Curvature ◽  
Individual Approach ◽  
Fitting In ◽  
Corneal Diameter ◽  
Clinical Cases

We described two clinical cases of ortho-k lenses fitting in patients with “non-typical” corneal curvature/diameter ratio. The main goal was to acknowledge effective and safe use of this myopia correction method in patients with corneal diameter greater than 11 mm. Individual approach to each patient is the key to a successful and safe ortho-k lenses fitting.

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