Comparison on Network Simulation Techniques

Development of an Interactive Microprocessor Based Workload Evaluation Model (SIMWAM)

Proceedings of the Human Factors Society Annual Meeting ◽

10.1177/154193128402800123 ◽

1984 ◽

Vol 28 (1) ◽

pp. 78-80 ◽

Cited By ~ 3

Author(s):

Mark Kirkpatrick ◽

Thomas B. Malone ◽

Phillip J. Andrews

Keyword(s):

Human Factors ◽

Evaluation Model ◽

Network Simulation ◽

Aircraft Carrier ◽

Simulation Techniques

In an attempt to assess the extent to which human factors technology developed for air systems is applicable to ship systems problems, several task network simulation techniques were evaluated for aircraft carrier air operations. Such operations are complex and highly variable and include over 400 separate tasks performed by 18 different operators. The result of the assessment was that the available techniques were not acceptable, leading to the development of a model designated SIMWAM for simulation for workload assessment and modeling.

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Experiences applying parallel and interoperable network simulation techniques in on-line simulations of military networks

Proceedings 16th Workshop on Parallel and Distributed Simulation ◽

10.1109/pads.2002.1004205 ◽

2005 ◽

Cited By ~ 11

Author(s):

K. Perumalla ◽

R. Fujimoto ◽

T. McLean ◽

G. Riley

Keyword(s):

Network Simulation ◽

Simulation Techniques ◽

On Line ◽

Military Networks

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Large-scale network simulation techniques

ACM SIGCOMM Computer Communication Review ◽

10.1145/956993.956999 ◽

2003 ◽

Vol 33 (3) ◽

pp. 27-41 ◽

Cited By ~ 25

Author(s):

Garrett R. Yaun ◽

David Bauer ◽

Harshad L. Bhutada ◽

Christopher D. Carothers ◽

Murat Yuksel ◽

...

Keyword(s):

Large Scale ◽

Network Simulation ◽

Simulation Techniques ◽

Large Scale Network ◽

Scale Network

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Image Analysis of Intramembrane Particles in Freeze-Fractured Biomembranes Using Computer Simulation Techniques

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100114694 ◽

1975 ◽

Vol 33 ◽

pp. 214-215

Author(s):

D.J. Benefiel ◽

R.S. Weinstein

Keyword(s):

Membrane Proteins ◽

Freeze Fracture ◽

Integral Membrane Proteins ◽

Systematic Evaluation ◽

Intramembrane Particles ◽

Modeling Methods ◽

Simulation Techniques ◽

Freeze Fracture Electron Microscopy ◽

Fracture Electron ◽

Computer Simulation Techniques

Intramembrane particles (IMP or MAP) are components of most biomembranes. They are visualized by freeze-fracture electron microscopy, and they probably represent replicas of integral membrane proteins. The presence of MAP in biomembranes has been extensively investigated but their detailed ultrastructure has been largely ignored. In this study, we have attempted to lay groundwork for a systematic evaluation of MAP ultrastructure. Using mathematical modeling methods, we have simulated the electron optical appearances of idealized globular proteins as they might be expected to appear in replicas under defined conditions. By comparing these images with the apearances of MAPs in replicas, we have attempted to evaluate dimensional and shape distortions that may be introduced by the freeze-fracture technique and further to deduce the actual shapes of integral membrane proteins from their freezefracture images.

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Σ =13 tilt grain boundary in silicon bicrystal

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100175946 ◽

1990 ◽

Vol 48 (4) ◽

pp. 562-563

Author(s):

M.J. Kim ◽

Y.L. Chen ◽

R.W. Carpenter ◽

J.C. Barry ◽

G.H. Schwuttke

Keyword(s):

Grain Boundary ◽

Grain Boundaries ◽

Rotation Axis ◽

Czochralski Method ◽

High Resolution Electron Microscopy ◽

Image Simulation ◽

Simulation Techniques ◽

Resolution Electron ◽

The Common ◽

Tilt Grain Boundary

The structure of grain boundaries (GBs) in metals, semiconductors and ceramics is of considerable interest because of their influence on physical properties. Progress in understanding the structure of grain boundaries at the atomic level has been made by high resolution electron microscopy (HREM) . In the present study, a Σ=13, (510) <001>-tilt grain boundary in silicon was characterized by HREM in conjunction with digital image processing and computer image simulation techniques.The bicrystals were grown from the melt by the Czochralski method, using preoriented seeds. Specimens for TEM observations were cut from the bicrystals perpendicular to the common rotation axis of pure tilt grain boundary, and were mechanically dimpled and then ion-milled to electron transparency. The degree of misorientation between the common <001> axis of the bicrystal was measured by CBED in a Philips EM 400ST/FEG: it was found to be less than 1 mrad. HREM was performed at 200 kV in an ISI-002B and at 400 kv in a JEM-4000EX.

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