scholarly journals A resonant cavity for single-shot emittance measurement

Author(s):  
J.S. Kim ◽  
C.D. Nantista ◽  
D.H. Whittum ◽  
R.H. Miller ◽  
S.G. Tantawi ◽  
...  
2011 ◽  
Author(s):  
G. G. Manahan ◽  
E. Brunetti ◽  
R. P. Shanks ◽  
M. R. Islam ◽  
B. Ersfeld ◽  
...  

2005 ◽  
Vol 76 (12) ◽  
pp. 125109
Author(s):  
J. S. Kim ◽  
C. D. Nantista ◽  
R. H. Miller ◽  
A. W. Weidemann

2003 ◽  
Vol 783 ◽  
Author(s):  
Charles E Free

This paper discusses the techniques that are available for characterising circuit materials at microwave and millimetre wave frequencies. In particular, the paper focuses on a new technique for measuring the loss tangent of substrates at mm-wave frequencies using a circular resonant cavity. The benefits of the new technique are that it is simple, low cost, capable of good accuracy and has the potential to work at high mm-wave frequencies.


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