Considerations regarding the efficiency of high power RF sources for particle accelerators

Author(s):  
G. Clerc ◽  
C. Bearzatto ◽  
M. Bres ◽  
G. Faillon ◽  
Ph. Guidee
2009 ◽  
Vol 168 (2) ◽  
pp. 264-269
Author(s):  
S. Chiriki ◽  
J. Fachinger ◽  
R. Moormann ◽  
H.-K. Hinssen ◽  
A. Bukaemskiy ◽  
...  

1988 ◽  
Vol 6 (3) ◽  
pp. 613-620
Author(s):  
M. V. Fazio ◽  
R. F. Hoeberling

The evolution of rf-accelerator technology toward high-power, high-current, lowemittance beams produces an ever-increasing demand for efficient, very high power microwave power sources. The present klystron technology has performed very well but is not expected to produce reliable gigawatt peak-power units in the 1- to 10-GHz regime. Further major advancements must involve other types of sources. The reflexing-electron class of sources can produce microwave powers at the gigawatt level and has demonstrated operation from 800-MHz to 40-GHz. The pulse length appears to be limited by diode closure, and reflexing-electron devices have been operated in a repetitively pulsed mode. A design is presented for a reflexing electron microwave amplifier that is frequency and phase locked. In this design, the generated microwave power can be efficiently coupled to one or several accelerator loads. Frequency and phase-locking capability may permit parallel-source operation for higher power. The low-frequency (500-MHz to 10-GHz) operation at very high power required by present and proposed microwave particle accelerators makes an amplifier, based on reflexing electron phenomena, a candidate for the development of new accelerator power sources.


Author(s):  
K. F. Russell ◽  
L. L. Horton

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.


2005 ◽  
Vol 48 (2) ◽  
pp. 208-217 ◽  
Author(s):  
Matthew Watson ◽  
Carl Byington ◽  
Douglas Edwards ◽  
Sanket Amin

Sign in / Sign up

Export Citation Format

Share Document