Development of hardware redundant embryonic structure for high reliability control applications

2010 ◽  
Author(s):  
Cs. Szasz ◽  
V. Chindris
Keyword(s):  
High Reliability ◽  
Control Applications ◽  
Reliability Control ◽  
Embryonic Structure

High reliability control circuit of pwm inverter for electric car drive

1979 ◽  
Author(s):  
T. Katta ◽  
M. Ibamoto ◽  
H. Narita ◽  
H. Kiwaki ◽  
Y. Onoda ◽  
...  
Keyword(s):  
High Reliability ◽  
Control Circuit ◽  
Pwm Inverter ◽  
Electric Car ◽  
Reliability Control

The Design and Application of DCS in Control System for Ceramic Kiln

2013 ◽  
Vol 321-324 ◽  
pp. 1848-1853
Author(s):  
Ming Yi ◽  
Zhi Ping Yang
Keyword(s):  
Control System ◽  
Software Design ◽  
High Reliability ◽  
Control Technology ◽  
Fuel Ratio ◽  
Advanced Control ◽  
Reliability Control ◽  
And Control ◽  
Design And Application ◽  
Monitor And Control

For the characteristics of control system for ceramic kiln, a new high-reliability control system is presented in this paper, using a hierarchical configuration, the DCS control system for three subsystem is designed, The temperature and atmosphere of kiln are controlled by fuel metering and air fuel ratio with computer and PLC, the structure and software design of the system are introduced, It is an advanced control technology. It’s validity is verified in a practical kiln monitor and control system. This template explains and demonstrates how to prepare your camera-ready paper for Trans Tech Publications. The best is to read these instructions and follow the outline of this text.

Failure Analysis With the Scanning Electron Microscope

1972 ◽  
Vol 30 ◽  
pp. 482-483
Author(s):  
John R. Devaney
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
High Reliability ◽  
Military Applications ◽  
Small Structure ◽  
Useful Life ◽  
Insight Into ◽  
Scanning Electron

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.

Sign in / Sign up

Export Citation Format

Share Document