Surface profiling and characterization of microlenses utilizing a Shack-Hartmann wavefront sensor

2011 ◽  
Author(s):  
Chenhui Li ◽  
Gunnsteinn Hall ◽  
Bader Aldalali ◽  
Difeng Zhu ◽  
Kevin Eliceiri ◽  
...  
Keyword(s):  
Wavefront Sensor ◽  
Surface Profiling

Characterization of the digital holographic wavefront sensor

2014 ◽  
Author(s):  
Pablo Marin Palomo ◽  
Andreas Zepp ◽  
Szymon Gładysz
Keyword(s):  
Wavefront Sensor

Integration, testing, and laboratory characterization of the mid-high layer wavefront sensor for LINC-NIRVANA

2006 ◽  
Author(s):  
Matteo Lombini ◽  
Italo Foppiani ◽  
Emiliano Diolaiti ◽  
Jacopo Farinato ◽  
Roberto Ragazzoni ◽  
...  
Keyword(s):  
Wavefront Sensor ◽  
Integration Testing ◽  
Laboratory Characterization ◽  
High Layer

Laboratory characterization of a Foucault-like wavefront sensor for adaptive optics

1998 ◽  
Author(s):  
Armando Riccardi ◽  
N. Bindi ◽  
Roberto Ragazzoni ◽  
Simone Esposito ◽  
Paolo Stefanini
Keyword(s):  
Adaptive Optics ◽  
Wavefront Sensor ◽  
Laboratory Characterization

Characterization of absorptance losses in optical materials using a high resolution Hartmann-Shack wavefront sensor

2008 ◽  
Author(s):  
A. Bayer ◽  
F. Barkusky ◽  
U. Leinhos ◽  
T. Miege ◽  
B. Schäfer ◽  
...  
Keyword(s):  
High Resolution ◽  
Optical Materials ◽  
Wavefront Sensor

High-resolution studies of small metallic particles in supported catalysts

1990 ◽  
Vol 48 (4) ◽  
pp. 254-255
Author(s):  
M. José-Yacamán
Keyword(s):  
Surface Roughness ◽  
High Resolution ◽  
Supported Catalysts ◽  
Accurate Information ◽  
Metallic Particles ◽  
Surface Profiling ◽  
Amorphous Substrate ◽  
Key Issues ◽  
Calculated Image

One of the key issues in the study of catalytic activity of small particles is the identification of surface sites in which reactions are promoted. This requires the characterization of the surface roughness. Profile HREM images has been used to characterize the surface of smal1 particles. This method has yield interesting information about surface reconstruction. In the study of supported catalysts, one has to deal with the contribution to the image from the (usually amorphous) substrate. A typical catalyst of Pt supported in γ-Al2O3 is shown in Fig. 1. The active part of the catalyst is the metallic particle. The thickness of the support is not known. Noise from the substrate makes surface profiling somewhat difficult. An alternative technique to study surface roughness is presented in this work. The method takes advantage of the fact that images of atomic columns are shifted as a function of the thickness. Fig. 2 shows a superposition of a calculated image for a cubo-octahedral at-300Å defocuss and the projected potential. The image clearly shows a shift on the images, which is mainly related to thickness changes (at a given defocuss). combining calculations with image processing of the High resolution photographs it is possible to obtain a very accurate information about surface topography.

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