Impact of fiber aging and cable repair in an installed 28-nm transatlantic 96 x 10 Gb/s DWDM system

2005 ◽  
Author(s):  
B. Bakhshi ◽  
L. Rahman ◽  
G. Mohs ◽  
M. Vaa ◽  
W.W. Patterson ◽  
...  
Keyword(s):  
Fiber Aging ◽  
Dwdm System ◽  
28 Nm

Combining Current Imaging, EBIC/EBAC, and Electrical Probing for Fast and Reliable In-Situ Electrical Fault Isolation

2016 ◽  
Author(s):  
Stephan Kleindiek ◽  
Matthias Kemmler ◽  
Andreas Rummel ◽  
Klaus Schock
Keyword(s):  
Imaging Technique ◽  
Fault Isolation ◽  
28 Nm

Abstract Using a compact nanoprobing setup comprising eight probe tips attached to piezo-driven micromanipulators, various techniques for fault isolation are performed on 28 nm samples inside an SEM. The recently implemented Current Imaging technique is used to quickly image large arrays of contacts providing a means of locating faults.

High Speed 1-tap Decision Feedback Equalizer in 28 nm CMOS

2014 ◽  
Vol 9 (9th) ◽  
pp. 1-12
Author(s):  
Mostafa Hosny ◽  
Sameh Ibrahim ◽  
DiaaEldin Khalil ◽  
Mohamed Dessouky
Keyword(s):  
High Speed ◽  
Decision Feedback ◽  
Decision Feedback Equalizer ◽  
28 Nm

Loopback method for study of long-range DWDM system

LastMile ◽  
2017 ◽  
pp. 54-59
Author(s):  
E. Bogdanova ◽  
A. Sigaev
Keyword(s):  
Long Range ◽  
Dwdm System

A Simultaneous Phase Shifter and Up-Converter for the 28/38/60-GHz Bands in 28-nm CMOS

2020 ◽  
Author(s):  
David del Rio ◽  
Chia-Jen Liang ◽  
Ching-Wen Chiang ◽  
Roc Berenguer ◽  
Mau-Chung Frank Chang ◽  
...  
Keyword(s):  
Phase Shifter ◽  
60 Ghz ◽  
28 Nm

Gate Leakage for 28 nm Stacked HfZrOx Dielectric of p-Channel MOSFETs After Decoupled Plasma Nitridation Treatment With Annealing Temperatures

2014 ◽  
Vol 42 (12) ◽  
pp. 3712-3715 ◽  
Author(s):  
Shea-Jue Wang ◽  
Mu-Chun Wang ◽  
Win-Der Lee ◽  
Jie-Min Yang ◽  
L. S. Huang ◽  
...  
Keyword(s):  
Gate Leakage ◽  
Plasma Nitridation ◽  
Annealing Temperatures ◽  
28 Nm

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

2021 ◽  
Author(s):  
Shuting Shi ◽  
Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Arm Processor ◽  
28 Nm
Sign in / Sign up

Export Citation Format

Share Document