FWM-assisted Raman laser for second-order Raman pumping

2003 ◽  
Author(s):  
F. Leplingard ◽  
S. Borne ◽  
C. Martinelli ◽  
C. Leclere ◽  
T. Lopez ◽  
...  
Keyword(s):  
Raman Laser ◽  
Second Order

scholarly journals Evaluation of 100G DP-QPSK long-haul transmission performance using second order co-pumped Raman laser based amplification

2015 ◽  
Vol 23 (17) ◽  
pp. 22181 ◽  
Author(s):  
Mingming Tan ◽  
Paweł Rosa ◽  
Son Thai Le ◽  
Ian. D. Phillips ◽  
Paul Harper
Keyword(s):  
Raman Laser ◽  
Second Order ◽  
Transmission Performance

Optimization of an intracavity Q-switched solid-state second order Raman laser

Laser Physics ◽  
2016 ◽  
Vol 27 (1) ◽  
pp. 015405
Author(s):  
Zhiqiong Chen ◽  
Xihong Fu ◽  
Hangyu Peng ◽  
Jun Zhang ◽  
Li Qin ◽  
...  
Keyword(s):  
Solid State ◽  
Raman Laser ◽  
Second Order

ZnWO4/Nd∶YAG Second-Order Raman Laser at 1318 nm

2020 ◽  
Vol 40 (5) ◽  
pp. 0536001
Author(s):  
任席奎 Ren Xikui ◽  
谢建 Xie Jian ◽  
阮双琛 Ruan Shuangchen ◽  
裴继红 Pei Jihong ◽  
王欣 Wang Xin ◽  
...  
Keyword(s):  
Raman Laser ◽  
Second Order

scholarly journals Stability analysis of second order pulsed Raman laser in dispersion managed systems

2011 ◽  
Author(s):  
Salih K. Kalyoncu ◽  
Shiming Gao ◽  
En-Kuang Tien ◽  
Yuewang Huang ◽  
Dogukan Yildirim ◽  
...  
Keyword(s):  
Stability Analysis ◽  
Raman Laser ◽  
Second Order

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

Sign in / Sign up

Export Citation Format

Share Document