Noise Optimization and Monte Carlo Simulation of a PET Detector Based on Continuous LSO Crystal and Large-Area APDs

2006 ◽  
Author(s):  
S. Krishnamoorthy ◽  
S. Stoll ◽  
M. Purschke ◽  
J.-F. Pratte ◽  
C. L. Woody ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Large Area ◽  
Noise Optimization

NOISE OPTIMIZATION OF ULTRA-SHORT GATE HEMTs USING MONTE CARLO SIMULATION

2001 ◽  
Author(s):  
JAVIER MATEOS ◽  
TOMÁS GONZÁLEZ ◽  
DANIEL PARDO ◽  
SYLVAIN BOLLAERT ◽  
THIERRY PARENTY ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Noise Optimization

scholarly journals Quantitative Comparison of the Spatial Distribution of Radar and Gauge Rainfall Data

2012 ◽  
Vol 13 (6) ◽  
pp. 1939-1953 ◽  
Author(s):  
Seong-Sim Yoon ◽  
Anh Tran Phuong ◽  
Deg-Hyo Bae
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Spatial Distribution ◽  
Simulation Experiment ◽  
Interpolation Method ◽  
Rain Gauge ◽  
Observation Data ◽  
Storm Events ◽  
Large Area ◽  
Radar Rainfall

Abstract The common statement that a rain gauge network usually provides better observation at specific points while weather radar provides more accurate observation of the spatial distribution of rain field over a large area has never been subjected to quantitative evaluation. The aim of this paper is to evaluate the statement by using some statistical criteria. The Monte Carlo simulation experiment, inverse distance weighting (IDW) interpolation method, and cross-validation technique are used to investigate the relation between the accuracy of the interpolated rainfall and the rain gauge density. The radar reflectivity–rainfall intensity (Z–R) relationship is constructed by the least squares fitting method from observation data of radar and rain gauges. The variation in this relationship and the accuracy of the radar rainfall with rain gauge density are evaluated by using the Monte Carlo simulation experiment. Three storm events are selected as the case studies. The obtained results show that the accuracy of interpolated and radar rainfall increases nonlinearly with increasing gauge density. The higher correlation coefficient (γ) value of radar-rainfall estimation, compared to gauge interpolation, especially in the convective storm, proves that radar observation provides a more accurate spatial structure of the rain field than gauge observation does.

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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