Design and testing of monolithic active pixel sensors for charged particle tracking

2002 ◽  
Author(s):  
G. Deptuch ◽  
J.D. Berst ◽  
G. Claus ◽  
C. Colledani ◽  
W. Dulinski ◽  
...  
Keyword(s):  
Charged Particle ◽  
Particle Tracking ◽  
Active Pixel Sensors ◽  
Active Pixel ◽  
Pixel Sensors ◽  
Charged Particle Tracking ◽  
Design And Testing

Design and testing of monolithic active pixel sensors for charged particle tracking

2002 ◽  
Vol 49 (2) ◽  
pp. 601-610 ◽  
Author(s):  
G. Deptuch ◽  
J.-D. Berst ◽  
G. Claus ◽  
C. Colledani ◽  
W. Dulinski ◽  
...  
Keyword(s):  
Charged Particle ◽  
Particle Tracking ◽  
Active Pixel Sensors ◽  
Active Pixel ◽  
Pixel Sensors ◽  
Charged Particle Tracking ◽  
Design And Testing

scholarly journals On the radiation tolerance of CMOS Monolithic Active Pixel Sensors with partially depleted active volume

2021 ◽  
Author(s):  
◽  
Michael Deveaux
Keyword(s):  
Charged Particle ◽  
Particle Tracking ◽  
Radiation Detectors ◽  
Heavy Ion ◽  
Radiation Tolerance ◽  
Tracking Accuracy ◽  
Active Pixel Sensors ◽  
Active Pixel ◽  
Pixel Sensors ◽  
Charged Particle Tracking

CMOS Monolithic Active Pixel Sensors for charged particle tracking (CPS) form are ultra-light and highly granular silicon pixel detectors suited for highly sensitive charged particle tracking. Unlike to most other silicon radiation detectors, they rely on standard CMOS technology. This cost efficient approach allows for building particularly small and thin pixels but also introduced, until recently, substantially constraints on the design of the sensors. The most important among them is the missing compatibility with the use of PMOS transistors and depleted charge collection diodes in the pixel. Traditional CPS were thus first of all suited for vertex detectors of relativistic heavy ion and particle physics experiments, which require highest tracking accuracy in combination with moderate time resolution and radiation tolerance. This work reviews the R&D on understanding and improving the radiation tolerance of traditional CPS with non- and partially depleted active medium as pioneered by the MIMOSA-series developed by the IPHC Strasbourg. It introduces the specific measurement methods used to assess the radiation tolerance of those non-standard pixels. Moreover, it discusses the major mechanisms of radiation damage and procedures for radiation hardening, which allowed to extend the radiation tolerance of the devices by more than an order of magnitude.

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