Experimental Study of Tribological Properties of Silicon-Based MEMS/NEMS Surface with Atomic Force Microscope

2006 ◽  
Author(s):  
J.N. Ding ◽  
G.X. Xie ◽  
Z. Fan ◽  
P. Yang ◽  
Q. Wang
Keyword(s):  
Experimental Study ◽  
Atomic Force Microscope ◽  
Tribological Properties ◽  
Atomic Force ◽  
Silicon Based

Experimental Manipulation of Gold Nano-Particles by Atomic Force Microscope and Investigating Effect of Various Working Parameters

2013 ◽  
Vol 829 ◽  
pp. 831-835
Author(s):  
Seyed Abbas Shahmoradi Zavareh ◽  
Hamid Akbari Moayyer ◽  
Mohammad Amin Ahouei
Keyword(s):  
Experimental Study ◽  
Atomic Force Microscope ◽  
Scanning Speed ◽  
Experimental Manipulation ◽  
Nano Particles ◽  
Mica Surface ◽  
Contact Mode ◽  
Atomic Force ◽  
Gold Nano Particles ◽  
Working Parameters

Due to involvement of various fields of engineering and bio researchers in nanoprojects and their need in achieving certain layout of nanoparticles (NPs) in many research studies, considerable attention is paid to nanomanipulation nowadays. The present experimental study employs Atomic Force Microscope (AFM) in order to push gold nanoparticles on a highly flat mica surface. A silicon probe in contact mode is used to both image and manipulate nanoparticles and Topo and L-R images have been obtained to show the successes of manipulation when proper conditions are fulfilled. The effect of AFM parameters such as applied force, scanning speed and number of pixels of image on nanomanipulation efficiency is investigated. Moreover, the tip is moved along a special path which can be set by software to study manipulation of nanoparticles aggregates. Finally, possible applications of nanomanipulation in nanomechanics, nanoelectronics, nanomaterials and bio-technology are reported and further experimental research works on nanomanipulation are proposed.

Experimental Study on Cryogenic Polishing Single Silicon Wafer with Nano-Sized Cerium Dioxide Powders

2007 ◽  
Vol 24-25 ◽  
pp. 177-182 ◽  
Author(s):  
Yu Li Sun ◽  
Dun Wen Zuo ◽  
Yong Wei Zhu ◽  
Rong Fa Chen ◽  
D.S. Li ◽  
...  
Keyword(s):  
Experimental Study ◽  
Atomic Force Microscope ◽  
Silicon Wafer ◽  
Cerium Dioxide ◽  
Smooth Surface ◽  
Silicon Wafers ◽  
Atomic Force ◽  
Polishing Pad

Cryogenic polishing single silicon wafer with nano-sized CeO2 abrasives can be known as cryogenic fixed abrasives CMP (CFA-CMP). The abrasive slurry was made of nano-sized CeO2 particles dispersed in de-ionized water with a surfactant and the polishing slurry froze to form cryogenic polishing pad. Then the polishing tests of the blanket silicon wafers in the presence of the cryogenic polishing pad containing the nano-particulates were carried out. The morphologies and surfaces roughness of the polished silicon wafers were observed and examined on an atomic force microscope (AFM). The results show that a super smooth surface with roughness of 0. 293 nm is obtained within 5000 nm× 5000 nm and the removal of material is dominated by plastic flowage.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

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