scholarly journals Assembly-Line-Compatible Electromagnetic Characterization of Antenna Substrates for Wearable Applications using Polynomial Chaos

Author(s):  
Thomas Deckmyn ◽  
Marco Rossi ◽  
Sam Agneessens ◽  
Hendrik Rogier ◽  
Dries Vande Ginste
2006 ◽  
Vol 128 (39) ◽  
pp. 12600-12601 ◽  
Author(s):  
Sylvie Garneau-Tsodikova ◽  
Pieter C. Dorrestein ◽  
Neil L. Kelleher ◽  
Christopher T. Walsh

2017 ◽  
Vol 2017 ◽  
pp. 1-15 ◽  
Author(s):  
Anis Krayni ◽  
Abdelhamid Hadjem ◽  
Günter Vermeeren ◽  
Alain Sibille ◽  
Christophe Roblin ◽  
...  

This paper deals with a new methodology to assess the exposure induced by both uplink and downlink of a cellular network using 3D electromagnetic simulations. It aims to analyze together the exposure induced by a personal device (uplink exposure) and that induced by a base station (downlink exposure). The study involved the major parameters contributing to variability and uncertainty in exposure assessment, such as the user’s posture, the type of wireless device, and the propagation environment. Our approach is relying basically on the modeling of the power radiated by the personal device and the ambient electric field, while taking into account the effects of human body shadowing and the propagation channel fluctuations. The exposure assessment as well as the human-wave interactions has been simulated using the finite difference in time domain method (FDTD). In uplink scenarios, four FDTD simulations were performed with a child model, used in two postures (sitting and standing) and in two usage scenarios (voice and data), which aimed to examine the exposure induced by a mobile phone and a tablet emitting, respectively, at 900 MHz and 1940 MHz. In the downlink scenario, a series of FDTD simulations of an exposure to a single plane wave and multiplane waves have been conducted, and an efficient metamodeling of the exposure using the Polynomial Chaos approach has been developed.


2007 ◽  
Vol 14 (1) ◽  
pp. 31-40 ◽  
Author(s):  
Gitanjali M. Singh ◽  
Frédéric H. Vaillancourt ◽  
Jun Yin ◽  
Christopher T. Walsh
Keyword(s):  

2016 ◽  
Vol 11 (8) ◽  
pp. 2254-2264 ◽  
Author(s):  
Oleksandr Yushchuk ◽  
Bohdan Ostash ◽  
Thu H. Pham ◽  
Andriy Luzhetskyy ◽  
Victor Fedorenko ◽  
...  
Keyword(s):  

2017 ◽  
Vol 16 ◽  
pp. 1365-1368 ◽  
Author(s):  
Marco Rossi ◽  
Sam Agneessens ◽  
Hendrik Rogier ◽  
Dries Vande Ginste

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