In situ microwave characterization of insulator thin films for interconnects of advanced circuits

2002 ◽  
Author(s):  
B. Flichet ◽  
C. Bermond ◽  
P. Ferrari ◽  
G. Angenieux
Keyword(s):  
Thin Films ◽  
Microwave Characterization

Microwave characterization of magnetic thin films

2004 ◽  
Vol 1 (12) ◽  
pp. 3744-3747 ◽  
Author(s):  
C. Nader ◽  
T. Boudiar ◽  
B. Bayard ◽  
A. Siblini ◽  
G. Noyel
Keyword(s):  
Thin Films ◽  
Magnetic Thin Films ◽  
Microwave Characterization

scholarly journals In Situ Lorentz Differential Phase Contrast STEM Characterization of Rashba Interaction on Skyrmion Thin Films

2018 ◽  
Vol 24 (S1) ◽  
pp. 1900-1901
Author(s):  
B. D. Esser ◽  
A. S. Ahmed ◽  
K. Meng ◽  
J. Rowland ◽  
M. Randeria ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Contrast ◽  
Differential Phase ◽  
Rashba Interaction ◽  
Differential Phase Contrast

In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O2 atmosphere

2012 ◽  
Vol 544 ◽  
pp. 34-38 ◽  
Author(s):  
T. Hosokai ◽  
A. Hinderhofer ◽  
A. Vorobiev ◽  
C. Lorch ◽  
T. Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Microwave Characterization of BST Thin Films on LAO Interdigital Capacitor

2003 ◽  
Vol 55 (1) ◽  
pp. 939-946 ◽  
Author(s):  
Y. L. Cheng ◽  
N. Chong ◽  
Y. Wang ◽  
J. Z. Liu ◽  
H. L. W. Chan ◽  
...  
Keyword(s):  
Thin Films ◽  
Bst Thin Films ◽  
Interdigital Capacitor ◽  
Microwave Characterization

Synthesis and Microwave Characterization of Polypyrrole-PVC Blends

1992 ◽  
Vol 247 ◽  
Author(s):  
F. Jousse ◽  
P. Hourquebie ◽  
C. Deleuze ◽  
L. Olmedo
Keyword(s):  
In Situ Growth ◽  
Oxidizing Agent ◽  
Direct Link ◽  
Reaction Parameters ◽  
Solvent Nature ◽  
Microwave Characterization ◽  
Agent Control ◽  
Thermoplastic Blends

ABSTRACT.: Thermoplastic blends have been created by in situ growth of polypyrrole in an insulating PVC matrix. This type of synthesis gives a level of conductivity of the order of 10−5 to 1 S/cm for concentrations of less than 15% (in weight). A study of the synthetic conditions shows that the reaction parameters (solvent, nature of oxidizing agent) control the eventual properties of the blend (structure, conductivity level). The microwave characterization of these materials has allowed us to establish a direct link between the method of processing and the radioelectric properties.

FT-IR, SIMS and electrical characterization of Si3N4 thin films obtained from CVD, assisted by in situ electrical discharge

1993 ◽  
Vol 24 (4) ◽  
pp. 389-393
Author(s):  
B. Balland ◽  
R. Botton ◽  
M. Lemiti ◽  
J.C. Bureau ◽  
A. Glachant
Keyword(s):  
Thin Films ◽  
Electrical Discharge ◽  
Electrical Characterization ◽  
Ft Ir

scholarly journals High-temperature (1500 K) reciprocal space mapping on a laboratory X-ray diffractometer

2007 ◽  
Vol 40 (2) ◽  
pp. 332-337 ◽  
Author(s):  
R. Guinebretière ◽  
A. Boulle ◽  
R. Bachelet ◽  
O. Masson ◽  
P. Thomas
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Reciprocal Space ◽  
Primary Beam ◽  
Sample Holder ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Translation Stage

A laboratory X-ray diffractometer devoted to thein situcharacterization of the microstructure of epitaxic thin films at temperatures up to 1500 K has been developed. The sample holder was built using refractory materials, and a high-accuracy translation stage allows correction of the dilatation of both the sample and the sample holder. The samples are oriented with respect to the primary beam with two orthogonal rotations allowing the registration of symmetric as well as asymmetric reciprocal space maps (RSMs). The association of a monochromatic primary beam and a position-sensitive detector allows the measurement of RSMs in a few minutes for single crystals and in a few hours for imperfect epitaxic thin films. A detailed description of the setup is given and its potential is illustrated by high-temperature RSM experiments performed on yttria-doped zirconia epitaxic thin films grown on sapphire substrates.

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