Automated Detection and Classification for Packed Android Applications

2016 ◽  
Author(s):  
Yibin Liao ◽  
Jiakuan Li ◽  
Bo Li ◽  
Guodong Zhu ◽  
Yue Yin ◽  
...  
Keyword(s):  
Automated Detection ◽  
Android Applications

LibSift: Automated Detection of Third-Party Libraries in Android Applications

2016 ◽  
Author(s):  
Charlie Soh ◽  
Hee Beng Kuan Tan ◽  
Yauhen Leanidavich Arnatovich ◽  
Annamalai Narayanan ◽  
Lipo Wang
Keyword(s):  
Automated Detection ◽  
Third Party ◽  
Android Applications

Automated detection of epithelial changes in colorectal carcinoma

2012 ◽  
Vol 50 (05) ◽  
Author(s):  
G Valcz ◽  
I Bándi ◽  
B Wichmann ◽  
A Patai ◽  
D Szabó ◽  
...  
Keyword(s):  
Colorectal Carcinoma ◽  
Automated Detection

Machine Learning in Agriculture

2018 ◽  
Vol 8 (6) ◽  
pp. 26 ◽  
Author(s):  
Matthew N. O. Sadiku ◽  
Chandra M. M Kotteti ◽  
Sarhan M. Musa
Keyword(s):  
Climate Change ◽  
Artificial Intelligence ◽  
Machine Learning ◽  
Disease Diagnosis ◽  
Automated Detection ◽  
Disease Prediction ◽  
Paper Briefly ◽  
Agriculture Sector ◽  
Modern Agriculture ◽  
Crop Disease

Machine learning is an emerging field of artificial intelligence which can be applied to the agriculture sector. It refers to the automated detection of meaningful patterns in a given data.  Modern agriculture seeks ways to conserve water, use nutrients and energy more efficiently, and adapt to climate change.  Machine learning in agriculture allows for more accurate disease diagnosis and crop disease prediction. This paper briefly introduces what machine learning can do in the agriculture sector.

Automated Detection of Pin Defects on Counterfeit Microelectronics

2018 ◽  
Author(s):  
Pallabi Ghosh ◽  
Domenic Forte ◽  
Damon L. Woodard ◽  
Rajat Subhra Chakraborty
Keyword(s):  
Integrated Circuits ◽  
Depth Map ◽  
Optical Microscope ◽  
Automated Detection ◽  
Detection Methods ◽  
Global Supply Chains ◽  
Subject Matter Experts ◽  
Security Breaches ◽  
The Past ◽  
Skilled Subject

Abstract Counterfeit electronics constitute a fast-growing threat to global supply chains as well as national security. With rapid globalization, the supply chain is growing more and more complex with components coming from a diverse set of suppliers. Counterfeiters are taking advantage of this complexity and replacing original parts with fake ones. Moreover, counterfeit integrated circuits (ICs) may contain circuit modifications that cause security breaches. Out of all types of counterfeit ICs, recycled and remarked ICs are the most common. Over the past few years, a plethora of counterfeit IC detection methods have been created; however, most of these methods are manual and require highly-skilled subject matter experts (SME). In this paper, an automated bent and corroded pin detection methodology using image processing is proposed to identify recycled ICs. Here, depth map of images acquired using an optical microscope are used to detect bent pins, and segmented side view pin images are used to detect corroded pins.

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