Mixed-level defect simulation in data-paths of digital systems

2003 ◽  
Author(s):  
R. Ubar ◽  
J. Raik ◽  
E. Ivask ◽  
M. Brik
Keyword(s):  
Digital Systems ◽  
Defect Simulation

Creating a standard method of controlling digital microscopes: the microscope access protocol (map)

1995 ◽  
Vol 53 ◽  
pp. 16-17
Author(s):  
T. A. Dodson ◽  
E. Völkl ◽  
L. F. Allard ◽  
T. A. Nolan
Keyword(s):  
Data Storage ◽  
Storage Systems ◽  
Digital Systems ◽  
Data Networks ◽  
Digital Microscopy ◽  
Command Language ◽  
Access Protocol ◽  
Analog To Digital ◽  
Basic Physics ◽  
Scanning Electron

The process of moving to a fully digital microscopy laboratory requires changes in instrumentation, computing hardware, computing software, data storage systems, and data networks, as well as in the operating procedures of each facility. Moving from analog to digital systems in the microscopy laboratory is similar to the instrumentation projects being undertaken in many scientific labs. A central problem of any of these projects is to create the best combination of hardware and software to effectively control the parameters of data collection and then to actually acquire data from the instrument. This problem is particularly acute for the microscopist who wishes to "digitize" the operation of a transmission or scanning electron microscope. Although the basic physics of each type of instrument and the type of data (images & spectra) generated by each are very similar, each manufacturer approaches automation differently. The communications interfaces vary as well as the command language used to control the instrument.

Testing of Digital Systems

2003 ◽  
Author(s):  
N. K. Jha ◽  
S. Gupta
Keyword(s):  
Digital Systems

Conversion of a D-Mode FET to an E-Mode FET via Electrostatic Discharge in a GaAs Power Amplifier Duplexer Module

2013 ◽  
Author(s):  
Rose Emergo ◽  
Steve Brockett
Keyword(s):  
Cross Section ◽  
Power Amplifier ◽  
Electrostatic Discharge ◽  
Fault Isolation ◽  
Design Change ◽  
Eds Analysis ◽  
Defect Simulation

Abstract This paper outlines the systematic isolation of an electrostatic discharge defect on a depletion-mode FET. Topics covered are fault isolation, FIB-STEM cross-section and EDS analysis, and defect simulation. Multiple GaAs PA devices were submitted for analysis after failing different reliability stresses. Fault isolation revealed ESD damage on a DFET connected to the VMODE0 pin. Simulation of the failure showed that, most likely, the defect was caused by CDM stress. A design change of inserting a resistor between the VMODE0 pin and the DFET made the device more robust against CDM stress.

QUESTIONS OF PERFECTION OF THE GOVERNMENT WITH A VIEW OF REDUCTION OF INVESTMENT RISKS AT DEVELOPMENT OF DIGITAL SYSTEMS WITH AN ARTIFICIAL INTELLECT

2020 ◽  
Vol 3 (8(77)) ◽  
pp. 48-54
Author(s):  
N.A. Novickij
Keyword(s):  
Digital Economy ◽  
Digital Systems ◽  
Economic Systems ◽  
National System ◽  
New Approaches ◽  
The Government

Questions of the government are considered(examined) by economy at development of digital systems with искуственным intelligence. Global tendencies of formation of digital economic systems are investigated. Market preconditions of development of digital systems are proved. Program methods of formation of digital systems new approaches of the organization digital уоправления by reinvestment cycles with искуственным intelligence are considered Are determined. Legal and legislative principles of creation of National system of the government are recommended digital economy.

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