Field leakage reduction using a two-dimensional matched numerical dispersion method and high-order cubic curvilinear interpolation [em programmer's notebook]

2013 ◽  
Vol 55 (6) ◽  
pp. 155-169
Author(s):  
Funda E. Yardim ◽  
Nursel Akcam
Keyword(s):  
High Order ◽  
Numerical Dispersion ◽  
Two Dimensional ◽  
Dispersion Method ◽  
Leakage Reduction

Explicit Kutta condition for unsteady two-dimensional high-order potential boundary element method

AIAA Journal ◽  
1997 ◽  
Vol 35 ◽  
pp. 1080-1081
Author(s):  
Giuseppe Davi ◽  
Rosario M. A. Maretta ◽  
Alberto Milazzo
Keyword(s):  
Boundary Element Method ◽  
Boundary Element ◽  
High Order ◽  
Two Dimensional ◽  
Kutta Condition ◽  
Element Method

High-order quasi–phase-matching harmonic generation in two-dimensional orthorhombic lattice

2004 ◽  
Vol 68 (6) ◽  
pp. 804-810 ◽  
Author(s):  
Boqin Ma ◽  
Ting Wang ◽  
Peigen Ni ◽  
Bingying Cheng ◽  
Daozhong Zhang
Keyword(s):  
Harmonic Generation ◽  
High Order ◽  
Phase Matching ◽  
Two Dimensional ◽  
Orthorhombic Lattice ◽  
Quasi Phase Matching

scholarly journals A two-dimensional high-order well-balanced scheme for the shallow water equations with topography and Manning friction

2021 ◽  
pp. 105152
Author(s):  
Victor Michel-Dansac ◽  
Christophe Berthon ◽  
Stéphane Clain ◽  
Françoise Foucher
Keyword(s):  
Shallow Water ◽  
Shallow Water Equations ◽  
High Order ◽  
Two Dimensional

EXTRAX: anImageJplug-in for electron diffraction intensity extraction

2009 ◽  
Vol 43 (1) ◽  
pp. 191-195 ◽  
Author(s):  
V. Dorcet ◽  
X. Larose ◽  
C. Fermin ◽  
M. Bissey ◽  
P. Boullay
Keyword(s):  
Image Processing ◽  
Electron Diffraction ◽  
Public Domain ◽  
High Order ◽  
Diffraction Spot ◽  
Two Dimensional ◽  
Diffraction Intensity ◽  
Dimensional Lattice ◽  
Peak Location ◽  
Modulation Vector

A plug-in (EXTRAX) has been developed forImageJ– a public domain Java-based program widely used for image processing and analysis in microscopy. This plug-in allows the extraction and measurement of intensities from electron diffraction spot patterns with a semi-automatic peak location based on a two-dimensional lattice given by the user. It is also possible to take into account supplementary spots originating from high-order Laue zones and/or the existence of a modulation vector.

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