Confocal fluorescence microscopy and force-volume imaging in atomic force microscopy: A signal processing perspective

2014 ◽  
Author(s):  
Charles Soussen
Keyword(s):  
Atomic Force Microscopy ◽  
Signal Processing ◽  
Fluorescence Microscopy ◽  
Confocal Fluorescence Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Volume Imaging ◽  
Confocal Fluorescence ◽  
Force Volume

Morphology of protein polymer hybrid films studied by atomic force microscopy and scanning confocal fluorescence microscopy

2003 ◽  
Vol 443 (1-2) ◽  
pp. 124-135 ◽  
Author(s):  
Philippe Foubert ◽  
Jurry M. Hannink ◽  
Fabian Köhn ◽  
Roel Gronheid ◽  
Nico A.J.M. Sommerdijk ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Confocal Fluorescence Microscopy ◽  
Hybrid Films ◽  
Force Microscopy ◽  
Protein Polymer ◽  
Polymer Hybrid ◽  
Atomic Force ◽  
Confocal Fluorescence

Ultrasonically synthesized organic liquid-filled chitosan microcapsules: part 2: characterization using AFM (atomic force microscopy) and combined AFM–confocal laser scanning fluorescence microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (16) ◽  
pp. 3192-3201 ◽  
Author(s):  
Srinivas Mettu ◽  
Qianyu Ye ◽  
Meifang Zhou ◽  
Raymond Dagastine ◽  
Muthupandian Ashokkumar
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Young’S Modulus ◽  
Laser Scanning ◽  
Young's Modulus ◽  
Organic Liquid ◽  
Confocal Laser Scanning ◽  
Confocal Laser ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy (AFM) is used to measure the stiffness and Young's modulus of individual microcapsules that have a chitosan cross-linked shell encapsulating tetradecane.

Fabrication of 2D-protein arrays using biotinylated thiols: results from fluorescence microscopy and atomic force microscopy

2004 ◽  
Vol 6 (17) ◽  
pp. 4358-4362 ◽  
Author(s):  
Christian Grunwald ◽  
Wolfgang Eck ◽  
Norbert Opitz ◽  
Jürgen Kuhlmann ◽  
Christof Wöll
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Protein Arrays ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

2013 ◽  
Vol 4 ◽  
pp. 32-44 ◽  
Author(s):  
Jannis Lübbe ◽  
Matthias Temmen ◽  
Sebastian Rode ◽  
Philipp Rahe ◽  
Angelika Kühnle ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Signal Processing ◽  
Transfer Function ◽  
Spectral Density ◽  
Thermal Noise ◽  
Noise Spectral Density ◽  
Force Microscopy ◽  
Atomic Force ◽  
Noise Limit ◽  
Signal Processing Electronics

The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density d z at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density d Δ f at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh-vacuum conditions. For a quantification of the noise figures, we calibrate the cantilever displacement signal and determine the transfer function of the signal-processing electronics. From the transfer function and the measured d z , we predict d Δ f for specific filter settings, a given level of detection-system noise spectral density d z ds and the cantilever-thermal-noise spectral density d z th. We find an excellent agreement between the calculated and measured values for d Δ f . Furthermore, we demonstrate that thermal noise in d Δ f , defining the ultimate limit in NC-AFM signal detection, can be kept low by a proper choice of the cantilever whereby its Q-factor should be given most attention. A system with a low-noise signal detection and a suitable cantilever, operated with appropriate filter and feedback-loop settings allows room temperature NC-AFM measurements at a low thermal-noise limit with a significant bandwidth.

Intracellular concentration map of magnesium in whole cells by combined use of X-ray fluorescence microscopy and atomic force microscopy

2011 ◽  
Vol 66 (11-12) ◽  
pp. 834-840 ◽  
Author(s):  
Stefano Lagomarsino ◽  
Stefano Iotti ◽  
Giovanna Farruggia ◽  
Alessia Cedola ◽  
Valentina Trapani ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Intracellular Concentration ◽  
X Ray ◽  
Whole Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use
Sign in / Sign up

Export Citation Format

Share Document