$\hbox{1}/f$ Noise in 45-nm RESET-State Phase-Change Memory Devices: Characterization, Impact on Memory Readout Operation, and Scaling Perspectives
2012 ◽
Vol 33
(11)
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pp. 1559-1561
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2014 ◽
Vol 85
(9)
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pp. 094904
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Keyword(s):
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2019 ◽
Vol 1237
◽
pp. 042064
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