Relationship Between Conduction Mechanism and Low-Frequency Noise in Polycrystalline- $\hbox{TiO}_{x}$-Based Resistive-Switching Memory Devices
2012 ◽
Vol 33
(7)
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pp. 1063-1065
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Keyword(s):
2011 ◽
Vol 50
(1R)
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pp. 011501
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2011 ◽
Vol 50
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pp. 011501
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2020 ◽
Vol 67
(12)
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pp. 5484-5489
Keyword(s):
2019 ◽
Vol 45
(5)
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pp. 5724-5730
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Keyword(s):
2018 ◽
Vol 52
(7)
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pp. 075103
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