Edge Effects in Self-Heating-Related Instabilities in p-Channel Polycrystalline-Silicon Thin-Film Transistors
2011 ◽
Vol 32
(12)
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pp. 1707-1709
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2007 ◽
Vol 54
(12)
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pp. 3276-3284
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2010 ◽
Vol 31
(8)
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pp. 830-832
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2020 ◽
Vol 67
(8)
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pp. 3163-3166
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2011 ◽
Vol 50
(3)
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pp. 03CB04
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2002 ◽
Vol 41
(Part 1, No. 11A)
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pp. 6313-6319
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