Charge Retention Loss in a $\hbox{HfO}_{2}$ Dot Flash Memory via Thermally Assisted Tunneling

2008 ◽  
Vol 29 (1) ◽  
pp. 109-110 ◽  
Author(s):  
Tahui Wang ◽  
H. C. Ma ◽  
C. H. Li ◽  
Y. H. Lin ◽  
C. H. Chien ◽  
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Charge Retention ◽  
Retention Loss ◽  
Assisted Tunneling

Charge Retention Loss and Its Mechanism of (Bi, La)4Ti3O12 Capacitors

2004 ◽  
Vol 67 (1) ◽  
pp. 85-91
Author(s):  
D. J. Kim ◽  
J. Y. Jo ◽  
Y. W. So ◽  
B. S. Kang ◽  
T. W. Noh ◽  
...  
Keyword(s):  
Charge Retention ◽  
Retention Loss

Improvement of Charge Retention in Flash Memory Devices by Very Light Doping of Lanthanum into an Aluminum-Oxide Blocking Layer

2012 ◽  
Vol 5 (8) ◽  
pp. 081102 ◽  
Author(s):  
Jong Kyung Park ◽  
Seok-Hee Lee ◽  
Jae Sub Oh ◽  
Ki-Hong Lee ◽  
Seung Ho Pyi ◽  
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Keyword(s):  
Aluminum Oxide ◽  
Flash Memory ◽  
Memory Devices ◽  
Blocking Layer ◽  
Charge Retention

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2019 ◽  
Vol 46 (1) ◽  
pp. 106-106 ◽  
Author(s):  
Yixin Luo ◽  
Saugata Ghose ◽  
Yu Cai ◽  
Erich F. Haratsch ◽  
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Flash Memory ◽  
Process Variation ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Retention Loss ◽  
Early Retention
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