scholarly journals An assessment of single-electron effects in multiple-gate SOI MOSFETs with 1.6-nm gate oxide near room temperature

2006 ◽  
Vol 27 (3) ◽  
pp. 182-184 ◽  
Author(s):  
Wei Lee ◽  
Pin Su ◽  
Hou-Yu Chen ◽  
Chang-Yun Chang ◽  
Ke-Wei Su ◽  
...  
2001 ◽  
Vol 40 (Part 1, No. 2A) ◽  
pp. 447-451 ◽  
Author(s):  
Ilgweon Kim ◽  
Sangyeon Han ◽  
Kwangseok Han ◽  
Jongho Lee ◽  
Hyungcheol Shin

2005 ◽  
Vol 87 (18) ◽  
pp. 182106 ◽  
Author(s):  
C. Pace ◽  
F. Crupi ◽  
S. Lombardo ◽  
C. Gerardi ◽  
G. Cocorullo

Author(s):  
Wei Lee ◽  
Pin Su ◽  
Hou-yu Chen ◽  
Chang-yun Chang ◽  
Ke-wei Su ◽  
...  

1999 ◽  
Vol 20 (12) ◽  
pp. 630-631 ◽  
Author(s):  
Ilgweon Kim ◽  
Sangyeon Han ◽  
Kwangseok Han ◽  
Jongho Lee ◽  
Hyungcheol Shin

AIP Advances ◽  
2020 ◽  
Vol 10 (11) ◽  
pp. 115101
Author(s):  
Kouta Ibukuro ◽  
Fayong Liu ◽  
Muhammad Khaled Husain ◽  
Moïse Sotto ◽  
Joseph Hillier ◽  
...  

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