Reliability investigation of 0.07-μm InGaAs-InAlAs-InP HEMT MMICs with pseudomorphic In0.75Ga0.25As channel
2003 ◽
Vol 24
(6)
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pp. 378-380
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Keyword(s):
2000 ◽
Vol 51-52
◽
pp. 441-448
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2003 ◽
Vol 51
(12)
◽
pp. 2548-2554
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Keyword(s):