Signal Frequency and Bandwidth Effects on the Performance of UWB Time-Reversal Technique

Estimation of parameters of ionospheric wave disturbances on the basis of measurements of the Doppler shift of signal frequency of low-orbiting satellites

International Journal of Geomagnetism and Aeronomy ◽

10.1029/2006gi000147 ◽

2008 ◽

Vol 8 (1) ◽

Author(s):

T. V. Chmyga ◽

V. F. Pushin ◽

O. F. Tyrnov ◽

O. V. Alexanova

Keyword(s):

Doppler Shift ◽

Signal Frequency ◽

Estimation Of Parameters ◽

Wave Disturbances ◽

Ionospheric Wave

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Time Reversal in Lossy Material: An Assessment

PIERS Online ◽

10.2529/piers070315073151 ◽

2006 ◽

Vol 3 (8) ◽

pp. 1259-1263

Author(s):

Ian Scott ◽

Ana Vukovic ◽

Phillip Sewell

Keyword(s):

Time Reversal ◽

Lossy Material

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Test Circuit Conditioning for Soft Defect Localization

ISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2014p0396 ◽

2014 ◽

Author(s):

Kristopher D. Staller ◽

Corey Goodrich

Keyword(s):

Laser Beam ◽

Failure Analysis ◽

Signal Frequency ◽

Dynamic Failure ◽

The Third ◽

Analysis Technique ◽

Test Circuit ◽

Defect Localization ◽

Manual Input ◽

Fast Dynamic

Abstract Soft Defect Localization (SDL) is a dynamic laser-based failure analysis technique that can detect circuit upsets (or cause a malfunctioning circuit to recover) by generation of localized heat or photons from a rastered laser beam. SDL is the third and seldom used method on the LSM tool. Most failure analysis LSM sessions use the endo-thermic mode (TIVA, XIVA, OBIRCH), followed by the photo-injection mode (LIVA) to isolate most of their failures. SDL is seldom used or attempted, unless there is a unique and obvious failure mode that can benefit from the application. Many failure analysts, with a creative approach to the analysis, can employ SDL. They will benefit by rapidly finding the location of the failure mechanism and forgoing weeks of nodal probing and isolation. This paper will cover circuit signal conditioning to allow for fast dynamic failure isolation using an LSM for laser stimulation. Discussions of several cases will demonstrate how the laser can be employed for triggering across a pass/fail boundary as defined by voltage levels, supply currents, signal frequency, or digital flags. A technique for manual input of the LSM trigger is also discussed.

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