Characterization techniques for stability and noise in microwave amplifiers under large-signal excitations

2016 ◽  
Author(s):  
Juan-Mari Collantes ◽  
Joaquin Portilla ◽  
Aitziber Anakabe ◽  
Nerea Otegi
Keyword(s):  
Large Signal ◽  
Characterization Techniques ◽  
Microwave Amplifiers

Application of Floquet theory to the large signal stability analysis of microwave amplifiers

WAMICON 2013 ◽  
2013 ◽  
Author(s):  
Fabio L. Traversa ◽  
Fabrizio Bonani ◽  
Federica Cappelluti ◽  
Simona Donati Guerrieri ◽  
Giovanni Ghione
Keyword(s):  
Stability Analysis ◽  
Floquet Theory ◽  
Large Signal ◽  
Signal Stability ◽  
Microwave Amplifiers

Phytosome Drug Delivery of Natural Products: A Promising Technique for Enhancing Bioavailability

2017 ◽  
Vol 7 (03) ◽  
Author(s):  
Rani Anjana ◽  
Kumar Sunil ◽  
Sharma Hitender ◽  
Khar R. K.
Keyword(s):  
Drug Delivery ◽  
Natural Products ◽  
Plant Extract ◽  
Herbal Extract ◽  
Present Review ◽  
Absorption Profile ◽  
Promising Technique ◽  
Characterization Techniques ◽  
Advanced Form

The phytosome technology was developed by Indena markedly enhancing the bioavailability of selected phytomedicines, by incorporating phospholipids into standardized plant extract, which improve their absorption and utilization. Phytosome are advanced form of herbal extract that shows better absorption profile than conventional herbal extract. The present review focus on the preparation and characterization techniques of phytosomes, merits and various landmarks in the field of phytosomes.

dC/dV and CV Characterization of Gate Resistance Defects in eDRAM Circuits

2013 ◽  
Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney
Keyword(s):  
Deep Submicron ◽  
Work Flow ◽  
Localization Technique ◽  
Characterization Techniques ◽  
Capacitance Voltage ◽  
Gate Resistance

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.

An Overview of 300 mm SOI Starting Wafer Quality and Its Yield Detractors

2005 ◽  
Author(s):  
Pei Y. Tsai ◽  
Junedong Lee ◽  
Paul Ronsheim ◽  
Lindsay Burns ◽  
Richard Murphy ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Device Fabrication ◽  
Sampling Plan ◽  
Silicon On Insulator ◽  
Manufacturing Processes ◽  
Circuit Performance ◽  
Characterization Techniques ◽  
Wafer Manufacturing

Abstract A stringent sampling plan is developed to monitor and improve the quality of 300mm SOI (silicon on insulator) starting wafers procured from the suppliers. The ultimate goal is to obtain the defect free wafers for device fabrication and increase yield and circuit performance of the semiconductor integrated circuits. This paper presents various characterization techniques for QC monitor and examples of the typical defects attributed to wafer manufacturing processes.

Large Signal Analysis of Varactor Upconverter

1968 ◽  
Vol 22 (8) ◽  
pp. 616-621
Author(s):  
Hirosi Nishiyama ◽  
Kenzi Murase
Keyword(s):  
Signal Analysis ◽  
Large Signal
Sign in / Sign up

Export Citation Format

Share Document