Network-on-SSD: A Scalable and High-Performance Communication Design Paradigm for SSDs

2013 ◽  
Vol 12 (1) ◽  
pp. 5-8 ◽  
Author(s):  
Arash Tavakkol ◽  
Mohammad Arjomand ◽  
Hamid Sarbazi-Azad
Keyword(s):  
High Performance ◽  
Communication Design ◽  
Design Paradigm

scholarly journals FENOMENA DIGITAL ERA REVOLUSI INDUSTRI 4.0

2019 ◽  
Vol 4 (1) ◽  
pp. 47
Author(s):  
Farid Abdullah
Keyword(s):  
Los Angeles ◽  
Visual Communication ◽  
Design Education ◽  
Industrial Revolution ◽  
Visual Effects ◽  
Visual Communication Design ◽  
Communication Design ◽  
Digital Era ◽  
Design Paradigm ◽  
Set Up

<p><strong>Abstract </strong></p><p><strong></strong><br />Digital Phenomena in Industrial Revolution 4.0. Entering the era of Industrial Revolution 4.0, the Indonesian government set up a roadmap in the form of Making Indonesia 4.0. To support the digital phenomenon, this article is strengthened by public lecture Eric Hanson CEO of xRez Studio Inc. Greater Los Angeles, USA, on February 5, 2018 themed “Creating Digital Cities”. As a designer, visual effects senior producer,<br />and 3-dimensional digital artist he has been in the production of visual effects-based films in Holywood. The arrival of Hanson made an important contribution to Visual Communication and Multimedia Design education in Indonesia. Visual communication design paradigm according to Hanson experiencing a media shifting. Many works of art, multi media, prints, previously leaning on consumables, shifted to E-media. The existence of this e-media is difficult to resist and many of the efficiency it produces.<br />Hanson also explained his arrival as a form of introduction to the younger generation the opportunities of work in the field of visual communication design.</p><p><br /><strong>Abstrak</strong><br />Fenomena Digital Era Revolusi Industri 4.0. Memasuki era Revolusi Industri 4.0, pemerintah Indonesia menyusun peta jalan berupa Making Indonesia 4.0. Untuk mendukung fenomena digital tersebut, tulisan ini diperkuat kuliah umum Eric Hanson, CEO xRez Studio Inc. Greater Los Angeles, USA, bertema “Creating Digital Cities”.<br />Pendekatan yang dipakai dalam tulisan ini adalah deskriptif-naratif, memakai teori Rogers E. Shoemaker (1995) difusi teknologi komputer terhadap komunitas seni. Fenomena desain komunikasi visual menurut Hanson mengalami perubahan media (media shifting). Banyak karya seni, multimedia, cetakan, yang sebelumnya bersandar pada bahan habis, bergeser pada e-media. Keberadaan e-media ini sulit ditolak dan banyak efisiensi yang dihasilkannya. Simpulan dari tulisan ini adalah telah terjadi fenomena digitalisasi di berbagai kota-kota dunia dan perlunya introduksi kepada generasi muda tanah air terhadap peluang-peluang kerja di bidang desain</p>

scholarly journals CMOS Image Sensor with On-Chip Image Compression: A Review and Performance Analysis

2010 ◽  
Vol 2010 ◽  
pp. 1-17 ◽  
Author(s):  
Milin Zhang ◽  
Amine Bermak
Keyword(s):  
Image Processing ◽  
Performance Analysis ◽  
Image Compression ◽  
High Performance ◽  
Cmos Technology ◽  
Image Sensor ◽  
Processing Unit ◽  
Cmos Image Sensors ◽  
Design Paradigm ◽  
On Chip

Demand for high-resolution, low-power sensing devices with integrated image processing capabilities, especially compression capability, is increasing. CMOS technology enables the integration of image sensing and image processing, making it possible to improve the overall system performance. This paper reviews the current state of the art in CMOS image sensors featuring on-chip image compression. Firstly, typical sensing systems consisting of separate image-capturing unit and image-compression processing unit are reviewed, followed by systems that integrate focal-plane compression. The paper also provides a thorough review of a new design paradigm, in which image compression is performed during the image-capture phase prior to storage, referred to as compressive acquisition. High-performance sensor systems reported in recent years are also introduced. Performance analysis and comparison of the reported designs using different design paradigm are presented at the end.

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

Use of the Magnetostatic Analogue In Electromagnetic Lens Engineering

1970 ◽  
Vol 28 ◽  
pp. 360-361
Author(s):  
John W. Coleman
Keyword(s):  
Boundary Conditions ◽  
High Performance ◽  
Force Fields ◽  
Optical Design ◽  
Direct Conversion ◽  
Design Engineering ◽  
Design Data ◽  
Scalar Potentials ◽  
Geometric Elements ◽  
At Will

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.

Prospects for convergent beam electron diffraction with a 200kV cold field-emission transmission electron microscope

1991 ◽  
Vol 49 ◽  
pp. 466-467
Author(s):  
J W Steeds ◽  
R Vincent
Keyword(s):  
Field Emission ◽  
High Performance ◽  
Small Diameter ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Good Crystallinity ◽  
Special Modification ◽  
Convergent Beam

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.

Current State of Biological High-Resolution Scanning Electron Microscopy

1988 ◽  
Vol 46 ◽  
pp. 180-181 ◽  
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Performance ◽  
Low Voltage ◽  
Backscattered Electrons ◽  
Lens Position ◽  
Low Voltage Operation ◽  
Signal Collection ◽  
Probe Size ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

A high-performance oil-free backing pump for electron microscopes

1978 ◽  
Vol 36 (1) ◽  
pp. 110-111
Author(s):  
G.K.W. Balkau ◽  
E. Bez ◽  
J.L. Farrant
Keyword(s):  
Molecular Weight ◽  
Electron Microscope ◽  
Hot Spots ◽  
High Performance ◽  
Carbonaceous Material ◽  
Contamination Rate ◽  
Low Molecular Weight ◽  
Principal Source ◽  
Rotary Pumps ◽  
Electron Microscopes

The earliest account of the contamination of electron microscope specimens by the deposition of carbonaceous material during electron irradiation was published in 1947 by Watson who was then working in Canada. It was soon established that this carbonaceous material is formed from organic vapours, and it is now recognized that the principal source is the oil-sealed rotary pumps which provide the backing vacuum. It has been shown that the organic vapours consist of low molecular weight fragments of oil molecules which have been degraded at hot spots produced by friction between the vanes and the surfaces on which they slide. As satisfactory oil-free pumps are unavailable, it is standard electron microscope practice to reduce the partial pressure of organic vapours in the microscope in the vicinity of the specimen by using liquid-nitrogen cooled anti-contamination devices. Traps of this type are sufficient to reduce the contamination rate to about 0.1 Å per min, which is tolerable for many investigations.

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