Real-Time Integral Imaging Based on Extremely High Resolution Video System

2006 ◽  
Vol 94 (3) ◽  
pp. 490-501 ◽  
Author(s):  
F. Okano ◽  
J. Arai ◽  
K. Mitani ◽  
M. Okui
2017 ◽  
Author(s):  
Md. Ashraful Alam ◽  
Md. Sifatul Islam ◽  
Mohd. Zishan Tareque ◽  
Mahfuze Subhani ◽  
M. Rashidur Rahman Rafi ◽  
...  

2014 ◽  
Author(s):  
Youngmo Jeong ◽  
Jonghyun Kim ◽  
Jiwoon Yeom ◽  
Byoungho Lee

Author(s):  
Qiong-Hua Wang ◽  
Yan Xing ◽  
Zhao-Long Xiong ◽  
Min Zhao

Author(s):  
Munkh-Uchral Erdenebat ◽  
Ki-Chul Kwon ◽  
Ji-Seong Jeong ◽  
Kwan-Hee Yoo ◽  
Nam Kim

2020 ◽  
Vol 458 ◽  
pp. 124752
Author(s):  
Weiping Huo ◽  
Xinzhu Sang ◽  
Shujun Xing ◽  
Yanxin Guan ◽  
Yuanhang Li

2014 ◽  
Vol 22 (9) ◽  
pp. 10210 ◽  
Author(s):  
Jonghyun Kim ◽  
Jae-Hyun Jung ◽  
Youngmo Jeong ◽  
Keehoon Hong ◽  
Byoungho Lee

2017 ◽  
Vol 46 (11) ◽  
pp. 1103007 ◽  
Author(s):  
赵敏 Zhao Min ◽  
熊召龙 Xiong Zhaolong ◽  
邢妍 Xing Yan ◽  
李小伟 Li Xiaowei ◽  
王琼华 Wang Qionghua

2014 ◽  
Vol 53 (01) ◽  
pp. 1 ◽  
Author(s):  
Ji-Seong Jeong ◽  
Ki-Chul Kwon ◽  
Munkh-Uchral Erdenebat ◽  
Yanling Piao ◽  
Nam Kim ◽  
...  

Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.


Sign in / Sign up

Export Citation Format

Share Document