A New Method of Measuring Localized Chromatic Dispersion of Structured Nanowaveguide Devices Using White-Light Interferometry

2012 ◽  
Vol 30 (1) ◽  
pp. 43-48 ◽  
Author(s):  
Dong Wook Kim ◽  
Seung Hwan Kim ◽  
Seoung Hun Lee ◽  
Kyong Hon Kim ◽  
Jong-Moo Lee ◽  
...  
Keyword(s):  
White Light ◽  
Chromatic Dispersion ◽  
New Method ◽  
White Light Interferometry

Chromatic dispersion measurement of nano-silicon waveguides using a white-light interferometry method

2011 ◽  
Author(s):  
Seung Hwan Kim ◽  
Seoung Hun Lee ◽  
Dong Wook Kim ◽  
Kyong Hon Kim ◽  
El-Hang Lee ◽  
...  
Keyword(s):  
White Light ◽  
Chromatic Dispersion ◽  
White Light Interferometry ◽  
Silicon Waveguides ◽  
Dispersion Measurement ◽  
Interferometry Method ◽  
Nano Silicon

Research on chromatic dispersion measurement of PCF based on Michelson white-light interferometry

2009 ◽  
Author(s):  
Dagong Jia ◽  
Yong Zhu ◽  
Feng Shi ◽  
Xuemin Zhang ◽  
Hongxia Zhang ◽  
...  
Keyword(s):  
White Light ◽  
Chromatic Dispersion ◽  
White Light Interferometry ◽  
Dispersion Measurement

Fringe order identification in optical fibre white-light interferometry using centroid algorithm method

1992 ◽  
Vol 28 (6) ◽  
pp. 553 ◽  
Author(s):  
S. Chen ◽  
A.W. Palmer ◽  
K.T.V. Grattan ◽  
B.T. Meggitt
Keyword(s):  
Optical Fibre ◽  
White Light ◽  
White Light Interferometry ◽  
Fringe Order ◽  
Centroid Algorithm

scholarly journals Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry

Sensors ◽  
2021 ◽  
Vol 21 (7) ◽  
pp. 2486
Author(s):  
Gert Behrends ◽  
Dirk Stöbener ◽  
Andreas Fischer
Keyword(s):  
White Light ◽  
Lateral Displacement ◽  
Displacement Measurement ◽  
Accurate Information ◽  
White Light Interferometry ◽  
Fully Integrated ◽  
Speckle Correlation ◽  
Dsc Measurements ◽  
Scanning White Light Interferometry ◽  
The Impact

Lateral scanning white light interferometry (LSWLI) is a promising technique for high-resolution topography measurements on moving surfaces. To achieve resolutions typically associated with white light interferometry, accurate information on the lateral displacement of the measured surface is essential. Since the uncertainty requirement for a respective displacement measurement is currently not known, Monte Carlo simulations of LSWLI measurements are carried out at first to assess the impact of the displacement uncertainty on the topography measurement. The simulation shows that the uncertainty of the displacement measurement has a larger influence on the total height uncertainty than the uncertainty of the displacing motion itself. Secondly, a sufficiently precise displacement measurement by means of digital speckle correlation (DSC) is proposed that is fully integrated into the field of view of the interferometer. In contrast to externally applied displacement measurement systems, the integrated combination of DSC with LSWLI needs no synchronization and calibration, and it is applicable for translatory as well as rotatory scans. To demonstrate the findings, an LSWLI setup with integrated DSC measurements is realized and tested on a rotating cylindrical object with a surface made of a linear encoder strip.

Polarization insensitive fibre-optic white-light interferometry

1995 ◽  
Vol 114 (5-6) ◽  
pp. 386-392 ◽  
Author(s):  
L.A Ferreira ◽  
J.L Santos ◽  
F Farahi
Keyword(s):  
White Light ◽  
Fibre Optic ◽  
White Light Interferometry ◽  
Polarization Insensitive

Fiber-optic white-light interferometry: lead sensitivity considerations

1994 ◽  
Vol 19 (2) ◽  
pp. 138 ◽  
Author(s):  
R. R. Gauthier ◽  
N. Dahi ◽  
F. Farahi
Keyword(s):  
White Light ◽  
Fiber Optic ◽  
White Light Interferometry
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