Impact of an Additional All-Optical Decision Element in Band-Limited Receivers for RZ Systems

2007 ◽  
Vol 25 (7) ◽  
pp. 1728-1734 ◽  
Author(s):  
Paolo Ghelfi ◽  
Marco Secondini ◽  
Mirco Scaffardi ◽  
Francesco Fresi ◽  
Antonella Bogoni ◽  
...  
Keyword(s):  
All Optical ◽  
Band Limited

scholarly journals Fiber Bragg Grating-Based Optical Signal Processing: Review and Survey

2021 ◽  
Vol 11 (17) ◽  
pp. 8189
Author(s):  
María R. Fernández-Ruiz ◽  
Alejandro Carballar
Keyword(s):  
Signal Processing ◽  
Optical Signal Processing ◽  
Low Cost ◽  
Spectral Response ◽  
Optical Signal ◽  
Physical Parameters ◽  
All Optical ◽  
Band Limited ◽  
Optic Systems ◽  
Signal Processors

This paper reviews the state of the art of fiber Bragg gratings (FBGs) as analog all-optical signal processing units. Besides the intrinsic advantages of FBGs, such as relatively low cost, low losses, polarization insensitivity and full compatibility with fiber-optic systems, they have proven to deliver an exceptional flexibility to perform any complex band-limited spectral response by means of the variation of their physical parameters. These features have made FBGs an ideal platform for the development of all-optical broadband filters and pulse processors. In this review, we resume the main design algorithms of signal processors based on FBGs, and we revisit the most common processing units based on FBGs and the applications that have been presented in the literature.

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

ALL-OPTICAL DIGITAL CIRCUITS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-459-C2-462 ◽  
Author(s):  
F. A.P. TOOLEY ◽  
B. S. WHERRETT ◽  
N. C. CRAFT ◽  
M. R. TAGHIZADEH ◽  
J. F. SNOWDON ◽  
...  
Keyword(s):  
Digital Circuits ◽  
All Optical

Method of estimation of hidden correlation of narrowband noise signals

2019 ◽  
pp. 34-39 ◽  
Author(s):  
E.I. Chernov ◽  
N.E. Sobolev ◽  
A.A. Bondarchuk ◽  
L.E. Aristarhova
Keyword(s):  
Signal Processing ◽  
Digital Signal Processing ◽  
New Technology ◽  
Digital Signal ◽  
Measuring Instruments ◽  
Central Frequency ◽  
Pearson Criterion ◽  
Useful Signal ◽  
Band Limited ◽  
Narrowband Noise

The concept of hidden correlation of noise signals is introduced. The existence of a hidden correlation between narrowband noise signals isolated simultaneously from broadband band-limited noise is theoretically proved. A method for estimating the latent correlation of narrowband noise signals has been developed and experimentally investigated. As a result of the experiment, where a time frag ent of band-limited noise, the basis of which is shot noise, is used as the studied signal, it is established: when applying the Pearson criterion, there is practically no correlation between the signal at the Central frequency and the sum of signals at mirror frequencies; when applying the proposed method for the analysis of the same signals, a strong hidden correlation is found. The proposed method is useful for researchers, engineers and metrologists engaged in digital signal processing, as well as developers of measuring instruments using a new technology for isolating a useful signal from noise – the method of mirror noise images.

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