Novel Scheme for Ultrafast All-Optical XOR Operation

2004 ◽  
Vol 22 (12) ◽  
pp. 2808-2815 ◽  
Author(s):  
S. Randel ◽  
A. Marques de Melo ◽  
K. Petermann ◽  
V. Marembert ◽  
C. Schubert
Keyword(s):  
Xor Operation ◽  
All Optical

All-optical neuromorphic XOR operation with inhibitory dynamics of a single photonic spiking neuron based on a VCSEL-SA

2020 ◽  
Vol 45 (5) ◽  
pp. 1104 ◽  
Author(s):  
Shuiying Xiang ◽  
Zhenxing Ren ◽  
Yahui Zhang ◽  
Ziwei Song ◽  
Yue Hao
Keyword(s):  
Spiking Neuron ◽  
Xor Operation ◽  
All Optical

scholarly journals All-Optical Logic Gate for XOR Operation Between 40-Gbaud QPSK Tributaries in an Ultra-Short Silicon Nanowire

2014 ◽  
Vol 6 (3) ◽  
pp. 1-7 ◽  
Author(s):  
Zuoshan Yin ◽  
Jian Wu ◽  
Jizhao Zang ◽  
Deming Kong ◽  
Jifang Qiu ◽  
...  
Keyword(s):  
Silicon Nanowire ◽  
Logic Gate ◽  
Optical Logic ◽  
Xor Operation ◽  
All Optical ◽  
Optical Logic Gate

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

ALL-OPTICAL DIGITAL CIRCUITS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-459-C2-462 ◽  
Author(s):  
F. A.P. TOOLEY ◽  
B. S. WHERRETT ◽  
N. C. CRAFT ◽  
M. R. TAGHIZADEH ◽  
J. F. SNOWDON ◽  
...  
Keyword(s):  
Digital Circuits ◽  
All Optical
Sign in / Sign up

Export Citation Format

Share Document