Understanding of hard and soft breakdown phenomena in thin gate oxides through carrier transport properties after breakdown

Author(s):  
S. Takagi ◽  
A. Takayanagi
2017 ◽  
Vol 10 (2) ◽  
pp. 024103 ◽  
Author(s):  
Toshinori Matsushima ◽  
Sunbin Hwang ◽  
Shinobu Terakawa ◽  
Takashi Fujihara ◽  
Atula S. D. Sandanayaka ◽  
...  

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