Work Function Measurement of Modified Tungsten Surface by Use of Photoemission Electron Microscope

2006 ◽  
Author(s):  
Y. Nakano ◽  
K. Yamane ◽  
H. Nakane ◽  
H. Adachi
Keyword(s):  
Electron Microscope ◽  
Work Function ◽  
Function Measurement ◽  
Tungsten Surface ◽  
Photoemission Electron

Surface reactions observed by photoemission electron microscopy (PEEM)

1992 ◽  
Vol 50 (1) ◽  
pp. 286-287
Author(s):  
H.H. Rotermund
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Work Function ◽  
Chemical Reactions ◽  
Reaction Diffusion ◽  
Dynamic Processes ◽  
Clean Surface ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
Photoemission Electron

Chemical reactions at a surface will in most cases show a measurable influence on the work function of the clean surface. This change of the work function δφ can be used to image the local distributions of the investigated reaction,.if one of the reacting partners is adsorbed at the surface in form of islands of sufficient size (Δ>0.2μm). These can than be visualized via a photoemission electron microscope (PEEM). Changes of φ as low as 2 meV give already a change in the total intensity of a PEEM picture. To achieve reasonable contrast for an image several 10 meV of δφ are needed. Dynamic processes as surface diffusion of CO or O on single crystal surfaces as well as reaction / diffusion fronts have been observed in real time and space.

In-vacuum work function measurement system

2016 ◽  
Author(s):  
Marcos Henrique Mamoru Otsuka Hamanaka ◽  
Vinicius do Lago Pimentel ◽  
Wellington Oliveira Avelino ◽  
Viviane Nogueira Hamanaka ◽  
Fernando Fuzinatto Dall'Agnol ◽  
...  
Keyword(s):  
Work Function ◽  
Measurement System ◽  
Function Measurement
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