Adaptable Design for Root Cause Analysis of a Model-Based Software Testing Process

2015 ◽  
Author(s):  
Mikko Nieminen ◽  
Tomi Raty
Keyword(s):  
Software Testing ◽  
Root Cause Analysis ◽  
Cause Analysis ◽  
Adaptable Design ◽  
Root Cause ◽  
Model Based

Transient Root Cause Analysis: A Model-Based Systems Engineering Methodology

2004 ◽  
Author(s):  
Trevor Bailey ◽  
Suzanne Woll ◽  
Rajul Misra ◽  
Kevin Otto
Keyword(s):  
Systems Engineering ◽  
Best Practice ◽  
Success Factors ◽  
System Modeling ◽  
Root Cause Analysis ◽  
System Level ◽  
Cause Analysis ◽  
Root Cause ◽  
Model Based ◽  
Model Based Systems Engineering

This paper presents a model-based systems engineering methodology that can be applied to perform a root cause analysis on transient systems. The methodology extends existing root cause analysis best practice by incorporating system modeling and analysis techniques. The methodology is deployed through a detailed 5-step process to understand, identify, assess, FMEA, and validate potential transient system-level root causes. A transient performance reliability analysis for a dual mode refrigeration system is used to demonstrate how the methodology can be applied. The paper also describes a set of success factors for applying the methodology using a phased approach with a large cross-functional team.

Root Cause analysis of SG tube ODSCC indications within the tube sheets of NPP biblis unit A

2011 ◽  
pp. 78-86
Author(s):  
R. Kilian ◽  
J. Beck ◽  
H. Lang ◽  
V. Schneider ◽  
T. Schönherr ◽  
...  
Keyword(s):  
Root Cause Analysis ◽  
Cause Analysis ◽  
Root Cause

Rule Construction and its Execution for Root Cause Analysis

2012 ◽  
Vol 132 (10) ◽  
pp. 1689-1697
Author(s):  
Yutaka Kudo ◽  
Tomohiro Morimura ◽  
Kiminori Sugauchi ◽  
Tetsuya Masuishi ◽  
Norihisa Komoda
Keyword(s):  
Root Cause Analysis ◽  
Cause Analysis ◽  
Root Cause

Root Cause Analysis Techniques Using Picosecond Time Resolved LADA

2014 ◽  
Author(s):  
Dan Bodoh ◽  
Kent Erington ◽  
Kris Dickson ◽  
George Lange ◽  
Carey Wu ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Picosecond Laser ◽  
Root Cause Analysis ◽  
Fault Isolation ◽  
Time Resolved ◽  
Cause Analysis ◽  
Root Cause ◽  
Design And Manufacturing ◽  
Multiple Interactions ◽  
Established Technique

Abstract Laser-assisted device alteration (LADA) is an established technique used to identify critical speed paths in integrated circuits. LADA can reveal the physical location of a speed path, but not the timing of the speed path. This paper describes the root cause analysis benefits of 1064nm time resolved LADA (TR-LADA) with a picosecond laser. It shows several examples of how picosecond TR-LADA has complemented the existing fault isolation toolset and has allowed for quicker resolution of design and manufacturing issues. The paper explains how TR-LADA increases the LADA localization resolution by eliminating the well interaction, provides the timing of the event detected by LADA, indicates the propagation direction of the critical signals detected by LADA, allows the analyst to infer the logic values of the critical signals, and separates multiple interactions occurring at the same site for better understanding of the critical signals.

Sign in / Sign up

Export Citation Format

Share Document