Simple simulation approach for the first trigger step of SEB (single event burn-out) based upon physical analysis for Si high voltage bipolar device

2016 ◽  
Author(s):  
Y. Yoshiura ◽  
M. Tabata ◽  
H. Muraoka ◽  
N. Taniguchi ◽  
K. Suzuki ◽  
...  
Keyword(s):  
High Voltage ◽  
Physical Analysis ◽  
Single Event ◽  
Simulation Approach ◽  
Simple Simulation ◽  
Burn Out ◽  
Bipolar Device

Numerical Analysis of the Corrosion of Buried Pipes near High Voltage Transmission Lines

2021 ◽  
Vol 35 (11) ◽  
pp. 1376-1377
Author(s):  
Dario Arango Angarita ◽  
Daniel Vargas Medina ◽  
Javier Araque Quijano
Keyword(s):  
High Voltage ◽  
Transmission Lines ◽  
Environmental Parameters ◽  
Corrosion Process ◽  
Physical Analysis ◽  
Buried Pipe ◽  
High Voltage Transmission Line ◽  
Analysis And Design ◽  
Typical Situation ◽  
High Voltage Transmission

We present the multi-physical analysis of the induction-corrosion process undergone by a buried pipe subject to electromagnetic induction from a nearby High Voltage Transmission Line (HVTL). The scenario analyzed models a typical situation found in Colombia by using realistic characteristics of the pipe, the HVTL, and environmental parameters such as soil resistivity. The results presented provide a quantitative view of the corrosion process and constitute a useful tool for the analysis and design of the increasingly common situation of pipelines running near HVTLs.

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes

2013 ◽  
Vol 53 (9-11) ◽  
pp. 1315-1319 ◽  
Author(s):  
N. Mbaye ◽  
V. Pouget ◽  
F. Darracq ◽  
D. Lewis
Keyword(s):  
Single Event ◽  
Power Diodes ◽  
Burn Out

scholarly journals Exploring the assumptions of multi-stock assessment models for humpback whales (Megaptera novaeangliae) in the Southern Hemisphere: using Breeding Stocks D and E as an example

2020 ◽  
pp. 119-128
Author(s):  
Rebecca Leaper ◽  
Samantha Peel ◽  
David Peel ◽  
Nick Gales
Keyword(s):  
Density Dependence ◽  
Population Model ◽  
Stock Assessment ◽  
Simulated Data ◽  
Megaptera Novaeangliae ◽  
Humpback Whales ◽  
Simulation Approach ◽  
Potential Value ◽  
Simple Simulation ◽  
Feeding Area

There is potential value in exploring multi-stock models to address situations where humpback stocks are mixing. However, sensitivity to the assumptions underlying these models has yet to be fully explored. Using a simple simulation approach, the assumptions of a population model that allows for mixing of humpback whale (Megaptera novaeangliae) stocks D and E on feeding areas has been explored by relaxing the assumptions of the original Johnston and Butterworth model in a number of plausible ways. First the ability of the model to estimate parameters was checked for a situation where simulated data are generated from an underlying model of exactly the same form for which the actual values of these parameters are known (Scenario 1). Then the ability of the model to estimate these parameters when alternative forms and assumptions were used for the underlying model generating the data was investigated. Specifically, stocks were allowed to mix non-uniformly across each feeding area and catch was non-uniformly distributed across each feeding area (Scenario 2). The consequences of density dependence implemented on feeding rather than breeding areas (Scenario 3) were also examined. The original mixing model was robust to alternate mixing and catch allocation scenarios in all but one of the simulations, but when density dependence acted at the level of the feeding rather than the breeding areas, the model produced estimates that were quite different from the underlying population. It is recommend that the inclusion of density dependence on feeding areas in models that allow for mixing of whales on these grounds be investigated further.

scholarly journals Single-Event Burnout of SiC Junction Barrier Schottky Diode High-Voltage Power Devices

2018 ◽  
Vol 65 (1) ◽  
pp. 256-261 ◽  
Author(s):  
A. F. Witulski ◽  
R. Arslanbekov ◽  
A. Raman ◽  
R. D. Schrimpf ◽  
A. L. Sternberg ◽  
...  
Keyword(s):  
Schottky Diode ◽  
High Voltage ◽  
Single Event ◽  
Power Devices

Simulation Approach for Modeling Single Event Upsets on Advanced CMOS SRAMS

1985 ◽  
Vol 32 (6) ◽  
pp. 4122-4127 ◽  
Author(s):  
Richard L. Johnson ◽  
Sherra E. Diehl-Nagle ◽  
John R. Hauser
Keyword(s):  
Single Event ◽  
Simulation Approach ◽  
Single Event Upsets
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